Technical method for integrated circuit design, test and measurement integration

Abstract

The invention relates to an integration circuit design, checking and testing integrated process which is realized by a computer-controlled integral system comprising, an automation design subsystem for presenting the key technical points of each steps from design input to printing chart, a verification subsystem for presenting rule inspection from electricity connected relation checking to geometry design and verification each key technical points, and a testing subsystem for presenting key points of testing survival and fault simulation.

Description

(1) Technical field [0001] The present invention belongs to the fields of integrated circuit design technology, verification technology and testing technology, and in particular refers to a technical method integrating the three to form a integrated circuit design, verification and testing centered on a unified database. (2) Background technology [0002] Integrated circuit design-verification-testing technology (Design-verification-testing technology for integrated circuits) is a new technology that integrates integrated circuit design technology, verification technology and testing technology. Its main body is the design technology of VLSI. When the integrated circuit develops to the very large scale (VLSI) stage, because the integration level of the circuit is greatly improved, the complexity of the circuit increases sharply, and each step of the design must be accompanied by effective verification. In this case, the design and verification of integrated circuits must be...

AI Technical Summary

Problems solved by technology

This technology has not fundamentally involved verification techniques such as geometrical design rule checking (DRC), circuit logic consistency checking (LVS), and testing techniques such as test generation and fault simulation

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