Nonlinear micro imaging method of multiphoton ionization induced by ultrashort pulse laser

Abstract

This invention relates to one super short impulse laser guided multiple photon non linear microscopes imaging method and its application, which uses focus super short impulse laser guidance object local surface gas or micro ionize to form micro area plasma, wherein, it adopts photoelectricity detector for plasma electromagnetic irradiation intensity within invisible light wave section; it gets object materials space change microscope images through recording object different position plasma irradiation intensity.

Description

【Technical field】 [0001] The invention relates to the technical field of material analysis and microscopic imaging, in particular to a new method and system of nonlinear microscopic imaging based on the multi-photon ionization process of atoms and molecules and its application. 【Background technique】 [0002] In the development of science and technology in the human world, microscopic imaging of microscopic objects and microscopic material analysis have always been an extremely important scientific research field, and breakthroughs in this field often have a significant role in promoting the development of other disciplines and technologies. From the earliest optical magnifying glass to modern super microscopes, such as scanning electron microscopes, atomic force microscopes and tunneling scanning microscopes, it can be said that the emergence of every new imaging technology is an important milestone in the development of science and technology. With the emergence of lasers ...

AI Technical Summary

Problems solved by technology

However, LIBS needs to use a relatively complex spectral analysis system, so it is often accompanied by problems such as insufficient utilization of the overall optical signal, large amount of test data, and long time

In addition, when the sensitivity of the spectral analysis system cannot meet the requirements, it is necessary to increase the intensity of the plasma signal by increasing the intensity of the irradiated laser, which increases the degree and scope of damage to the measured object, and serious damage will also cause causing a decrease in spatial resolution

Therefore, the application of LIBS has great limitations in microscopic imaging and material analysis in micro-regions on the micron or sub-micron scale.

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