Lithographic apparatus and device manufacturing method
a technology of lithographic apparatus and manufacturing method, which is applied in the direction of optical devices, photomechanical devices, instruments, etc., can solve the problems of increasing the overall distance that a substrate has to be displaced to achieve a full scan, imposing an upper limit on the maximum speed at which a substrate can be displaced relative to the projection system, and increasing the speed of the substrate. to achieve the effect of high throughpu
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[0038] Although specific reference can be made in this text to the use of lithographic apparatus in the manufacture of integrated circuits (ICs), it should be understood that the lithographic apparatus described herein can have other applications, such as the manufacture of integrated optical systems, guidance and detection patterns for magnetic domain memories, flat panel displays, thin-film magnetic heads, micro and macro fluidic devices, etc. The skilled artisan will appreciate that, in the context of such alternative applications, any use of the terms “wafer” or “die” herein can be considered as synonymous with the more general terms “substrate” or “target portion,” respectively. The substrate referred to herein can be processed, before or after exposure, in for example a track (e.g., a tool that typically applies a layer of resist to a substrate and develops the exposed resist) or a metrology or inspection tool. Where applicable, the disclosure herein ...
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