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TMR device with low magnetostriction free layer

a magnetostriction-free layer and tmr technology, applied in the field of high-performance tunneling magnetoresistive (tmr) sensors, can solve the problems of tmr ratio deformation and teach a high resistance property that is not acceptable for tmr, and achieve the effect of improving tmr ratio

Inactive Publication Date: 2009-05-14
HEADWAY TECH INC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

[0012]One objective of the present invention is to provide a TMR sensor with a free layer composition

Problems solved by technology

Unfortunately, the magnetostriction (λ) of a CoFeB free layer is considerably greater than the maximum acceptable value of about 5×10−6 for high density memory applications.
However,

Method used

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Abstract

A high performance TMR sensor is fabricated by employing a free layer comprised of CoBX with a λ between −5×10−6 and 0 on a MgOX tunnel barrier. Optionally, a FeCo/CoBX free layer configuration may be used where x is about 1 to 30 atomic %. Trilayer configurations represented by FeCo/CoFeB/CoBX, FeCo/CoBX/CoFeB, FeCoY/CoFeW/CoBX, or FeCoY/FeB/CoBX may also be employed. Alternatively, CoNiFeB or CoNiFeBM formed by co-sputtering CoB with CoNiFe or CoNiFeM, respectively, where M is V, Ti, Zr, Nb, Hf, Ta, or Mo may be substituted for CoBx in the aforementioned embodiments. A 15 to 30% in improvement in TMR ratio over a conventional CoFe/NiFe free layer is achieved while maintaining a low Hc and RA<3 ohm-um2. In bilayer or trilayer embodiments, λ between −5×10−6 and 5×10−6 is achieved by combining CoBx (−λ) and one or more layers having a positive λ.

Description

RELATED PATENT APPLICATION[0001]This application is related to the following: Docket # HT05-015, Ser. No. 11 / 180,808, filing date Jul. 13, 2005; assigned to a common assignee, and which is herein incorporated by reference in its entirety.FIELD OF THE INVENTION[0002]The invention relates to a high performance tunneling magnetoresistive (TMR) sensor in a read head and a method for making the same, and in particular, to a composite free layer comprised of CoB that reduces magnetostriction while achieving acceptable RA (resistance×area) and dR / R values.BACKGROUND OF THE INVENTION[0003]A TMR sensor otherwise known as a magnetic tunneling junction (MTJ) is a key component (memory element) in magnetic devices such as Magnetic Random Access Memory (MRAM) and a magnetic read head. A TMR sensor typically has a stack of layers with a configuration in which two ferromagnetic layers are separated by a thin non-magnetic insulator layer. The sensor stack in a so-called bottom spin valve configurat...

Claims

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Application Information

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IPC IPC(8): G11B5/33
CPCB82Y10/00B82Y25/00G01R33/093G01R33/18G11B5/3909G11B5/3912H01F10/3295G11C11/16H01F10/3254H01F10/3272H01L43/08H01L43/12H01L43/10G11B2005/3996G11C11/161Y10T428/1114H10N50/10H10N50/01H10N50/85G11B5/3906
Inventor WANG, HUI-CHUANZHAO, TONGLI, MINZHANG, KUNLIANG
Owner HEADWAY TECH INC
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