Dielectric reflector for amorphous silicon crystallization
a technology of dielectric reflector and amorphous silicon, which is applied in the direction of instruments, semiconductor devices, optics, etc., can solve the problems of reducing the mobility of peripheral circuit tfts, undesirably requiring additional masks and implantation processes and equipment, and not conducive to making tfts with low leakage current characteristics
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[0014]Referring to FIG. 1A, an insulating substrate 10 is provided which will form an LCD panel of an active matrix LCD device. The substrate 10 is made, for example, of glass and includes a pixel region 12 upon which pixel TFTs will be formed and a peripheral circuit region 14 upon which driver and other TFTs will be formed. A buffer layer 20 made of one or more films of dielectric material, such as silicon oxide, silicon nitride and combinations thereof, is formed over the substrate 10. The films of the buffer layer 20 may be formed using, for example, a chemical vapor deposition process and / or a physical vapor deposition process, and may have a thickness ranging between about 0.15 microns and about 0.3 microns.
[0015]In FIG. 1B, a semiconductor layer 30 of amorphous silicon (a-Si) is formed over the buffer layer 20. The a-Si layer 30 may be formed using a chemical vapor deposition or physical vapor deposition process, and may have a thickness ranging between about 0.04 microns and...
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