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Method for measuring microstructure rotation movement based on multiple centroid relative position invariability

A technology of rotary motion and microstructure, which is applied in the direction of measuring devices, optical devices, image data processing, etc., can solve the problems of large amount of calculation, large amount of calculation, too dense image pixel sampling, etc., and achieve simple implementation method and measurement resolution The effect of high rate and precise extraction

Inactive Publication Date: 2009-10-14
TIANJIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Through the comprehensive analysis and comparison of existing technologies, the technical solutions reported at present mainly have the following problems in practical applications: (1) Image matching is to select a sub-region in an image, and then select a sub-region in other images Search for the best matching sub-area, the relative position of the two sub-areas is the displacement amount, since the search is obtained by translating the sub-area, if there is a rotational movement, the sub-area needs to be rotated by different angles, and then the translation search is performed, and the calculation amount is very large large; (2) If the image correlation is performed in the time domain, the above-mentioned angle search traversal also exists, and the calculation amount is very large. If the image is converted from spatial coordinates to polar coordinates, the calculation amount is reduced, but the conversion from the rectangular coordinate system In the polar coordinate system, there is a problem of uneven sampling, that is, the image pixels close to the origin of the polar coordinates are sampled too densely, while the samples farther from the origin are too sparse, and each pixel contributes differently to the image in the transform domain, so the measurement of the rotation angle The resolution is not high; (3) The rotation angle measurement by extracting the edge of the image generally requires the edge to be a straight line, which limits the adaptability of the method; (4) The rotation angle of the microstructure is generally small, and the measurement resolution is required to be very high. High, the current measurement methods for macroscopic rotation angles cannot fully meet the requirements for the measurement resolution of microstructure rotation angles, and these measurement methods fail to take into account the common image features that exist on MEMS microstructures

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  • Method for measuring microstructure rotation movement based on multiple centroid relative position invariability
  • Method for measuring microstructure rotation movement based on multiple centroid relative position invariability
  • Method for measuring microstructure rotation movement based on multiple centroid relative position invariability

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Embodiment 1

[0030] This embodiment mainly focuses on the principle of the microstructure rotation angle measurement method based on the relative position invariance of multiple centroids and its implementation in the measurement of the rotation angle of a microgyro.

[0031] The main processing technology of MEMS includes bulk silicon processing technology and surface silicon processing technology, and the microstructure with movement ability belongs to the suspended structure, so the temporary support layer must be corroded by the corresponding etching process, so it is generally on the moving microstructure A certain number of corrosion holes are designed, and these corrosion holes have obvious grayscale differences with other parts of the microstructure in the image, which can be regarded as isolated image features.

[0032] figure 1 It is a schematic diagram of the principle of microstructure rotation angle measurement based on the relative position invariance of multiple centroids. ...

Embodiment 2

[0044] This embodiment mainly focuses on the application of the microstructure rotation angle measurement method based on the relative position invariance of multiple centroids in the microresonator.

[0045] The microresonator is an electrostatic device, which will generate motion under the action of an external excitation voltage signal. In this embodiment, the excitation voltage signal is a sine wave with a frequency of 23kHz, an amplitude of 10V, and a bias voltage of 40V, and the microresonator will reciprocate at the excitation frequency. While the ideal case for this reciprocating motion is only translation, there may be slight angular changes due to various factors in the machining process. Divide one excitation cycle of this sine wave by 30° phase, a cycle has 12 phases in total, and use stroboscopic imaging technology to obtain instantaneous motion images in each phase, then a complete motion cycle collects 13 images. Figure 6 and Figure 7 Planar images of the 0°...

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Abstract

The invention discloses a measuring micro structure whirligig method based on the invariable multi-centroidal relative position. The measuring method includes the catching the micro structure sport sequence image, selecting the isolated image character in micro structure image, distilling the isolated image centroidal, tracking the isolated image character in sport sequence image, analysis of the locus of multi centroidal link in sport sequence image and computing the rotating angle. The merits of the invention are: while the micro structure does the rigidity movement in plane, the change of locus of the isolated image centroidal can reflect the displacement, however, the relative position between two or more centroidals does not change, so the locus changing of the centroidal link can reflect the rotating angle. So it can pick up the plane rotating angel precisely by many isolated image centroidal link. The process is simple and has small compute but has high measurement distinguishability.

Description

technical field [0001] The invention relates to a method for measuring the rotational motion of a microstructure based on the relative position invariance of multiple centroids, which belongs to the photoelectric non-contact mechanical quantity measurement technology for micro-electromechanical systems. Background technique [0002] Micro-Electro-Mechanical Systems (MEMS) is developed on the basis of microelectronics technology. It is an integrated device or system composed of electronic and mechanical components. It is manufactured by a mass-processing process compatible with integrated circuits. At the same time, computing, sensing and execution are integrated, thus changing the way of perceiving and controlling the natural world. Most of the manufacturing processes of microelectromechanical systems (MEMS) are compatible with the processing technology in the field of microelectronics technology, but a considerable number of MEMS devices contain movable structures, which is...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/00G01B11/26G06T7/00G06T7/66
Inventor 胡晓东傅星胡小唐
Owner TIANJIN UNIV