Test equipment of steady state operation life in use for controlling junction temperature of transistor

A technology for controlling transistors and test equipment, applied in semiconductor/solid-state device testing/measurement, single semiconductor device testing, measuring devices, etc., can solve the problem of failure to eliminate defective products, reduce test reliability, and reduce test reliability and other issues to achieve the effect of easy expansion

Inactive Publication Date: 2007-12-26
BEIHANG UNIV
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Problems solved by technology

However, the measurement shows that the junction-to-case thermal resistance R of the 3DD63 transistor packaged in the B2-01 type th(j-c) Generally not more than 1.3 degrees Celsius per watt (°C/W), the actual junction temperature T j ≤140°C, lower than the junction temperature required by the standard As a result, the purpose of eliminating defective products cannot be achieved within the specified test time, thereby reducing the credibility of the test
[0011] The existing high-power transistor aging equipment has some shortcomings: for example, most of them use water cooling to control the case temperat

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  • Test equipment of steady state operation life in use for controlling junction temperature of transistor
  • Test equipment of steady state operation life in use for controlling junction temperature of transistor

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[0045] Please refer to shown in Fig. 1, a kind of steady-state working life test equipment of controlling transistor junction temperature of the present invention, it is by control system (comprising main control computer system 1 and junction temperature measurement and control system 2), power supply system 3 and test bench 4 composition. The control system is composed of a main control computer system 1 and a junction temperature measurement and control system 2 .

[0046] The main control computer system 1 includes a main control computer 11 , a data acquisition card (ie 1713 card) 13 and an I / O control card (ie 1734 card) 12 . The data acquisition card 13 is connected to the base and the emitter of each sample tube 41, and the data acquisition card 13 is used for real-time collection of the forward voltage drop V between the base and the emitter of the sample tube 41. BE And input main control computer 11 to process and record. I / O control card 12 links to each other wi...

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Abstract

A device used for testing stead-state service lifetime of junction temperature on control transistor consists of test operation table, control unit formed by master-control computer and junction temperature control and measurement component, and power supply unit formed by two sets of DC voltage-stabilized power supplies for controlling and measuring junction temperature of tested sample transistor in order to raise credibility of steady-state service lifetime test on power transistor.

Description

1. Technical field [0001] The invention is a steady-state working life test equipment for controlling transistor junction temperature, which belongs to the technical field of semiconductor device reliability test. 2. Background technology [0002] Steady-state working life test is an effective method to assess the reliability of power transistors. The current international standard IEC747-7-1988 and the equivalent Chinese national standard GB / T4587-94 and the US military standard MIL-STD-750D will This test is stipulated as a mandatory test item. [0003] The elements of steady-state working life test conditions include: [0004] ① The electrical stress of the transistor. For example, the electrical stress of the power transistor steady-state working life test specified in IEC747-7, GB / T4587 and the US military standard MIL-STD-750 is the same as the specified case temperature T c Corresponding maximum rated power P totmax . [0005] ②The junction temperature T of the t...

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Application Information

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IPC IPC(8): G01R31/26G01R31/00H01L21/66
Inventor 贾颖李逗曾晨晖曹红李霁红
Owner BEIHANG UNIV
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