Device for real-time monitoring inside of processor

Abstract

The invention discloses a device for detecting inner state of a micro processor in real time. During the design process of the micro processor, a plurality of partial monitors or a multi-level partial monitor and a global monitor are added, and the inner state information of the micro processor is serially output to a one-bit state-monitor output port with fixed cycle in circulating manner. The outer system is allocated with a signal-monitor collecting device which collects signal in the state-monitor output port of the micro processor, and is split-jointed into inner state information of the micro processor which has practical meanings through a shift memory, and is displayed on a front end PC machine finally. Small amount of hardware cost added in the design stage of the micro processor, real-time observability of the inner state of the micro processor under the situation of practical running mode of a chip is supported, and the shortcoming of measurable design technology of a traditional chip is compensated.

Description

Technical field [0001] The invention relates to a device for real-time monitoring of the internal state of a processor. Background technique [0002] With the continuous development of microprocessor technology and microelectronic processing technology, the scale and complexity of microprocessor chips (the chips mentioned below refer to microprocessor chips) continue to increase, which greatly increases the chip test time; although the chip packaging The number of pins has increased, but the number of pins used for external testing has been relatively reduced, and the difficulty of testing the internal logic of the chip has continued to increase; in addition, expensive test equipment makes the test cost increase exponentially with the complexity of the chip. For this reason, people have gradually realized the importance of the design-for-test (DFT: Design-For-Test) idea, that is, the mode of combining logic design and test design is adopted, and the designer will consider testabi...

AI Technical Summary

Problems solved by technology

These technologies have played a very important role in the initial debugging of the chip, but as the debugging intensity further increases, it is difficult for the control points added from the original input end of the chip to cover all the functions of the entire chip, and whether the design for test is successful or not Depends on the correctness and completeness of a large number of test circuits

Therefore, the traditional testability design technology still has some defects in practical application, which needs to be further improved.

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