Strength relating quantum imaging microscope

A technology of intensity correlation and quantum imaging, which can be used in microscopes, surgery, instruments, etc., and can solve problems such as the inability to use high numerical aperture objectives

Inactive Publication Date: 2008-10-08
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

[0003] In order to overcome the above-mentioned defects that some existing microscopic imaging devices cannot use high numerical aperture objective lenses due to the limitation of the detection environment, the present invention provides an intensity-correlated qu

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  • Strength relating quantum imaging microscope
  • Strength relating quantum imaging microscope
  • Strength relating quantum imaging microscope

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Embodiment Construction

[0029] The present invention will be further described below in conjunction with example and accompanying drawing, but should not limit protection scope of the present invention with this.

[0030] see first figure 1 , figure 1 It is a structural representation of the present invention. It can be seen from the figure that the intensity-correlated quantum imaging microscope of the present invention includes a pulsed light source 1, and the light beam emitted by the pulsed light source is divided into a transmitted light beam and a reflected light beam by a beam splitter 2. In the direction of the transmitted light beam, the object to be measured 3, The object arm formed by the object arm imaging lens 4 and the object arm detector 5, the object arm detector 5 is located at the image plane of the object arm imaging lens 4; in the direction of the reflected light beam is the virtual plane 7, Reference arm imaging lens 8 and reference arm detector 9 constitute reference arm, and ...

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Abstract

A strength related quantum imaging microscope is characterized by including a pulsed light source. The light beams generated by the pulse light source are divided into transmission light beams and reflectance light beams by a beam splitter; an object to be measured, an object arm imaging lens and an object arm detector are arranged in sequence at the transmission light beam direction to constitute an object arm, a virtual plane, a reference arm imaging lens and a reference arm detector are arranged in sequence at the reflection light beam direction to constitute a reference arm; the object arm detector and the reference arm detector are respectively connected to the computer through a first data acquisition card and a second data acquisition card, the computer is provided with a strength related arithmetic software, the computer is respectively connected to the pulse light source, the object arm detector and the reference arm detector through a synchronizing signal generator, and the reference arm imaging lens is provided with high numerical aperture. The invention can obtain a high resolutions image by increasing the numerical aperture of the reference arm imaging lens.

Description

technical field [0001] The invention relates to imaging technology, in particular to an intensity-correlated quantum imaging microscope capable of obtaining high-resolution images. Background technique [0002] High-resolution microscopy is one of the essential detection tools in many scientific researches and medical diagnoses. For a long time, people have been working to improve the resolving power of microscopy imaging systems. According to Abel's principle and Rayleigh's criterion, the resolution of a lens-based optical microscope depends on the wavelength of the incident light and the numerical aperture of the objective lens. Therefore, an objective lens with a high numerical aperture is one of the key factors to obtain a high-resolution image. However, in many practical applications, the probing environment of the microscopic equipment limits the use of high numerical aperture lenses. For example, when medical electronic endoscopes directly observe, diagnose and tre...

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Application Information

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IPC IPC(8): G02B21/00A61B1/00
Inventor 韩申生张鹏黎龚文林沈夏
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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