Low temperature scanning probe microscope system based on pulsatron refrigeration technology
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- INST OF PHYSICS - CHINESE ACAD OF SCI
- Publication Date
- 2008-10-29
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Abstract
Description
technical field
[0001] The present invention relates to a novel cryogenic scanning probe microscope (SPM) system. By combining pulse tube refrigeration technology, the system can reach a temperature below 4K without using liquid helium refrigerant, and has obvious advantages in low temperature maintenance time compared with traditional liquid helium refrigeration methods. Background technique
[0002] Scanning probe microscopy is currently the most widely used powerful tool for studying various physicochemical phenomena and effects at the nanoscale. In order to reduce electronic noise, realize atomic / molecular manipulation, and resolve splitting of fine energy levels, scanning probe microscope systems usually work in the liquid helium temperature region or lower. The traditional refrigeration method not only has a limited time for keeping low temperature, but also consumes a large amount of expensive liquid helium refrigerant, which makes the operation and maintenance costs...