Signal generation circuit for testing hall device electrical behavior

Abstract

The invention relates to a signal generation circuit for detecting electrical properties of a hall device, which comprises a main circuit power supply unit, a sine wave oscillation unit, a sine wave signal generation unit, a current signal generation unit and a voltage signal generation unit, the sine wave oscillation unit outputs sine waves, a singlechip controls the predetermined frequency of the sine waves output by the sine wave oscillation unit, the sine wave signal generation unit generates voltage control sine wave signals with adjustable amplitude and current control sine wave signals,the current signal generation unit and the voltage signal generation unit respectively output current and voltage signals required when detecting hall CT and PT and having the predetermined frequency(ranging from 0 to 1KHz) and adjustable amplitude. The invention also includes an adjustable direct current power supply unit which can output stable and adjustable direct current voltage for supplying a transmission device when in over-current or over-voltage protection regulation experiment. The signal generation circuit and the power supply unit can ensure the smooth output of sine waves, andhave advantages of relative small size and weight, convenient carrying and reduced costs.

Description

technical field [0001] The invention relates to the testing field of electric power and electronic equipment, and more specifically relates to a signal generating circuit for testing the electrical performance of a Hall device. Background technique [0002] More and more AC and DC digital electronic control devices are applied in industrial control, Hall Current Transformer (Hall Current Transformer, hereinafter referred to as Hall CT), PotentialTransformer (Hall Voltage Transformer, hereinafter referred to as Hall PT) As the main detection device of the electronic control device, it has been widely used due to its characteristics of high precision, fast response, high frequency, small size and low power consumption. Hall CT and PT include two parts: Hall element and Hall integrated circuit. The former is a simple Hall chip, which often needs to amplify the Hall voltage obtained when using it. The latter combines the Hall chip and its Signal processing circuits are integrat...

AI Technical Summary

Problems solved by technology

[0004] Aiming at the shortcomings of the above-mentioned common signal generation tester, such as the frequency and amplitude of the output signal are not adjustable, the output voltage is low, and it cannot output both AC and DC voltage and current signals, the present invention provides a device for testing Hall devices ( Hall CT, PT) signal generation circuit for electrical properties, the Hall CT, PT signal generation and tester using the circuit can output signals with adjustable frequency and amplitude, can output high voltage and can output AC voltage and current respectively signal and DC voltage current signal

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