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Immersion liquid recovery vibration-damping control device used for photo-etching machine

A liquid recovery and control device technology, which is applied in the direction of photolithographic process exposure devices, microlithography exposure equipment, etc., can solve problems such as the inability to effectively suppress the interference of the flow field of the vibration gap, increase the leakage of liquid to the outside, and achieve the purpose of suppressing vibration. and its impact on the gap flow field, reducing interference, and good system stability

Inactive Publication Date: 2009-04-08
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0008] (2). Control the pressure difference between the two ends of the recovery port (with orifice plate) within a small range. Although it reduces the sealing gas entering the recovery channel, it also inhibits the recovery of liquid and increases the possibility of liquid leakage.
[0009] (3). The gas-liquid separation and recovery method outside the recovery pipeline is far away from the source of the gas-liquid two-phase flow, and cannot effectively suppress the vibration caused by the gas-liquid two-phase mixed recovery at the recovery port and the interference to the gap flow field

Method used

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  • Immersion liquid recovery vibration-damping control device used for photo-etching machine
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  • Immersion liquid recovery vibration-damping control device used for photo-etching machine

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Embodiment Construction

[0035] The specific implementation of the present invention will be described below in conjunction with the drawings and examples.

[0036] figure 1 It schematically shows the assembly of the immersion liquid recovery vibration reduction control device 2 and the projection lens group according to the embodiment of the present invention. This device can be applied in step-and-repeat or step-and-scan lithography equipment. During the exposure process, the light emitted from the light source (not shown in the figure) (such as: ArF or F2 excimer laser) passes through the aligned mask plate (not shown in the figure), the projection lens group 1 and the immersion liquid The lens-substrate gap field exposes the photoresist on the surface of the substrate 3 .

[0037] Such as Figure 1 ~ Figure 4 It schematically shows the immersion adaptive sealing control device 2 of the embodiment of the present invention, which is composed of an upper end cover 2A, an inner cavity 2B and a lower...

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Abstract

The invention discloses an immersion liquid recovery vibration reduction control device used in a lithography machine. The immersion liquid recovery vibration reduction control device is arranged between a projection lens set and a substrate, and consists of an upper end cover, an internal cavity body and a lower end cover. Sealing is realized by double-layer recovery and applying single-layer gas to the outside, and an isolation groove is arranged between the internal layer recovery and the external layer recovery, which causes most of the liquid and the gas to be respectively recovered by the internal layer and the external layer, thus realizing the primary gas-liquid separation. A secondary separation is carried out after the gas and the liquid enter a recovery cavity, and the gas and the liquid are respectively recovered by an internal gas recovery cavity and an external gas recovery cavity, and a liquid recovery cavity, thus shortening the existence period of the gas liquid two-phase flow, and reducing gas bubble, vibration and impact on an exposure flow field caused by the two-phase flow and the phase transition process.

Description

technical field [0001] The invention relates to an immersion liquid recovery and vibration reduction control device in an immersion lithography (Immersion Lithography) system, in particular to an immersion liquid recovery and vibration reduction control device for a photolithography machine. Background technique [0002] Modern lithography equipment is based on optical lithography, which uses an optical system to accurately project and expose the pattern on the mask to the substrate (such as: silicon wafer) coated with photoresist. It includes an ultraviolet light source, an optical system, a projection mask composed of chip patterns, an alignment system and a substrate covered with photosensitive photoresist. [0003] The immersion lithography system fills a certain liquid in the gap between the projection lens and the substrate, and increases the numerical aperture (NA) of the projection lens by increasing the refractive index (n) of the medium in the gap, thereby improvin...

Claims

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Application Information

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IPC IPC(8): G03F7/20
Inventor 付新陈颖陈晖阮晓东
Owner ZHEJIANG UNIV
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