Silicon crystallization method
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- TERASEMICON CO LTD
- Publication Date
- 2009-06-03
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The present invention relates to a silicon crystallization method for producing polycrystalline silicon thin films. More specifically, the present invention relates to a silicon crystallization method for producing a high-quality polysilicon thin film applicable to thin film transistors (TFTs) used in liquid crystal displays (LCDs), organic light emitting displays (OLEDs), and the like. Background technique
[0002] Generally, TFTs are classified into amorphous silicon TFTs and polysilicon TFTs. The characteristics of TFT are evaluated by the value of electron mobility, because the electron mobility of amorphous silicon TFT is about 1cm 2 / Vs, the electron mobility of polysilicon TFT is about 100cm 2 / Vs or so, so high-performance LCD preferably adopts polysilicon TFT.
[0003] Polysilicon TFTs are produced by depositing amorphous silicon on a transparent substrate such as glass or quartz to make it polycrystalline, forming a gate oxide film and a g...