Apparatus and method for exploiting reverse short channel effects in transistor devices

A short-channel effect, transistor technology, applied in transistors, amplifiers with semiconductor devices/discharge tubes, semiconductor/solid-state device manufacturing, etc., can solve the problems of complex use of short-channel transistors, increase complexity, improve Linearity, effect of increasing circuit size

Inactive Publication Date: 2012-12-26
TELEFON AB LM ERICSSON (PUBL)
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The use of short-channel transistors is further complicated by the so-called "reverse short-channel effect" (RSCE)

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Apparatus and method for exploiting reverse short channel effects in transistor devices
  • Apparatus and method for exploiting reverse short channel effects in transistor devices
  • Apparatus and method for exploiting reverse short channel effects in transistor devices

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] figure 1 A "composite" transistor circuit 10 is shown formed by coupling a first transistor 10 with a second transistor 14 in parallel such that the two transistors 12 and 14 share a gate connection 16 , a drain connection 18 and a source connection 20 . (For a bipolar embodiment of the transistor circuit 10, these connections correspond to base, collector and emitter connections, respectively). Noting that in one or more embodiments, the transistor circuit 10 is implemented in an integrated circuit process, wherein the first transistor 12 comprises two or more integrated circuit transistor elements configured to have a first transistor channel length, Instead, the second transistor 14 includes two or more integrated circuit transistor elements configured to have a second transistor channel length.

[0024] In one or more embodiments, the first and second transistors 12 and 14 have substantially the same threshold voltage curve as a function of transistor channel leng...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A method of implementing a transistor circuit comprises coupling first and second transistors in parallel, wherein the first transistor has a channel length corresponding to a peak in the transistor's voltage threshold curve arising from reverse short channel effects, and the second transistor has a longer channel length and, therefore, a lower threshold voltage. Exploiting reverse short channel effects in this manner enables the implementation of "composite" transistor circuits that exhibit improved linearity.

Description

technical field [0001] The present invention relates generally to transistor devices, and more particularly to exploiting the reverse short channel effect in such devices. Background technique [0002] In most communication circuits, linear signal amplification represents a core enabling function. For example, wireless communication transceivers employ linear signal amplification at various stages in their transmit and receive signal processing paths. More particularly, radio frequency (RF) based communication systems rely on linear amplification in frequency mixing circuits, low noise amplification circuits, power amplification circuits, etc., to maintain signal fidelity and limit unwanted harmonic frequency generation. However, the non-linear current-voltage (IV) characteristics of semiconductor transistors, such as bipolar or MOS transistors, represent a fundamental source of signal non-linearity in communication circuits, which is heavily dependent on the use of these t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): H01L27/088
CPCH03F3/211H03F2200/492H01L27/088H03F2200/456H03F3/19H03F1/3205H03F2203/21178H01L21/823412H03F2200/451H03F3/45
Inventor T·亚伦伯
Owner TELEFON AB LM ERICSSON (PUBL)
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products