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Novel signal-ion micro-beam detector based on plastic scintillating fiber

A plastic scintillation and single-ion technology, which is applied in ion detection and optical fields, can solve the problems of inability to detect real-time changes in sample fluorescence signals, and achieve the effects of simple structure, broadened application range, and reduced losses

Inactive Publication Date: 2010-03-03
INST OF PLASMA PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0008] The present invention provides a novel single-ion micro-beam detector based on plastic scintillating optical fiber to solve the problem that the current micro-beam cannot detect the real-time change of the sample fluorescence signal while irradiating the sample, and can also irradiate opaque thick samples. It expands the application range of microbeams and improves the experimental efficiency

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Embodiment Construction

[0019] Such as figure 1 shown. A novel single-ion micro-beam detector based on plastic scintillation optical fiber, including a microscope, a single-ion micro-beam is arranged under the objective lens of the microscope, the exit port of the single-ion micro-beam is facing the objective lens of the microscope, and the sample to be tested is placed on the Between the objective lens of the microscope and the exit port of the single-ion micro-beam, there are also crushed plastic scintillation optical fibers and photomultiplier tubes. The flattened part of the plastic scintillation fiber is located between the exit port of the single-ion micro-beam and the sample to be tested. The plastic scintillation optical fiber is flattened by thermocompression forming technology, and the thickness of the flattened part is less than 50 microns, and the smaller the gap between the flattened part of the plastic scintillation optical fiber and the exit port of the single ion micro-beam, the bette...

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Abstract

The invention relates to a novel single-ion microbeam detector based on a plastic scintillating fiber, comprising a microscope, wherein a single-ion microbeam is arranged below the objective lens of the microscope; an exit port of the single-ion microbeam rightly faces the objective lens of the microscope; and a sample to be measured is arranged between the objective lens of the microscope and theexit port of the single-ion microbeam. The novel single-ion microbeam detector based on the plastic scintillating fiber also comprises a plastic scintillating fiber which is squashed and a photomultiplier, wherein the squashed part of the plastic scintillating fiber is located between the exit port of the single-ion microbeam and the sample to be measured; two ends of the plastic scintillating fiber are respectively coupled with the photomultiplier; the single-ion microbeam sends out an ion to the sample to be measured when the ion passes through the plastic scintillating fiber, the plastic scintillating fiber generates a photon and transmits the photon to the photomultiplier which converts an optical signal into an electrical signal, and then the ion passes through the plastic scintillating fiber and bombards the sample.

Description

technical field [0001] The invention relates to the fields of ion detection and optics, in particular to a novel single-ion micro-beam detector based on plastic scintillation optical fiber. Background technique [0002] With the continuous accumulation of human knowledge and the further improvement of the ability to understand nature, people are paying more and more attention to their living environment, especially the impact of ionizing radiation on health. In order to explore the biological damage caused by ionizing radiation, especially the internal mechanism of the interaction between low-dose radiation and living cells or tissues, researchers urgently need a device that can accurately position and project quantitative particles, that is, single-ion microbeams. [0003] Single-ion microbeam is an irradiation technology platform that can accurately generate a single ion with a positioning accuracy of micron scale. It can accurately project a certain number of ions to a sp...

Claims

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Application Information

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IPC IPC(8): G01T1/203C12Q1/02
Inventor 许永建詹福如陈连运李军陈斌余增亮吴李君吴跃进黄青
Owner INST OF PLASMA PHYSICS CHINESE ACAD OF SCI
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