Acquisition method and system of parameters of technique process

A process and parameter technology, which is applied in the collection of process parameters and the field of process parameter collection system, can solve the problem of wasting the system resources of the upper computer and the lower computer, it is difficult to timely and accurately reflect the production line equipment, and the data validity is difficult to guarantee and other issues to achieve the effect of reducing performance pressure and complexity, reducing overhead, and improving performance

Active Publication Date: 2010-03-17
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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AI Technical Summary

Problems solved by technology

Such data is obviously meaningless, that is, there will be too much junk data;
[0007] 2) This method of timing recording also causes the upper computer to send requests frequently, and the lower computer frequently reads data from the device, which greatly wastes the system resources of the upper computer and the lower computer;
[0008]3) It is difficult to timely and accurately reflect the status of the production line equipment, that is, the validity of the collected data is difficult to guarantee
For example, the change update time of parameter A is changed every 300ms, and the data collection time is to collect data every 200ms, then suppose the data is collected at 2009-7-209:26:27.000, and the data is collected at 2009-7-209 :26:27.300 has changed, but the existing technology can only collect data at 2009-7-209:26:27.400

Method used

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  • Acquisition method and system of parameters of technique process
  • Acquisition method and system of parameters of technique process
  • Acquisition method and system of parameters of technique process

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Embodiment Construction

[0045] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0046] The invention is applicable to numerous general purpose and special purpose computing system environments or configurations. For example: multiprocessor systems, servers, network PCs, minicomputers, mainframe computers, distributed computing environments including any of the above systems or devices, etc.

[0047] The invention may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The invention may also be practiced in distributed computing environments where tasks are perform...

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Abstract

The invention discloses an acquisition method of parameters of a technique process, which is used for acquiring the change condition of the parameters of the technique process with the time; the acquisition method comprises the following steps: when a lower computer detects that the parameters of the technique process pre-subscibed by an upper computer are changed, the upper machine is notified; and the upper computer acquires the technique process parameters and corresponding time information according to the notification, and stores the technique process parameters and corresponding time information in a database. The invention can reduce the acquisition of garbage data, guarantee the validity of the acquired data, and can effectively save system resources.

Description

technical field [0001] The invention relates to the technical field of production line equipment monitoring, in particular to a method for collecting process parameters and a system for collecting process parameters. Background technique [0002] With the development of a single process technology, as well as the increasingly complex and systematic degree of the process, the automatic control technology of the process is also applied more widely. [0003] For example, in order to monitor various data in the process and analyze the causes of hardware failures or unqualified products, the prior art proposes a data collection function. Data collection refers to the collection of data in the process, that is, to record the values ​​of various parameters in the process as time increases. By analyzing the collected data, the operator can monitor the status of the production line equipment, find problems in the process, accurately control or warn the process or equipment, and find...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/048G05B19/418
CPCY02P90/02
Inventor 马平付金生
Owner BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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