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Developing device and developing method

A development device and development method technology, applied in photography, optics, instruments, etc., can solve the problems of high cost, low throughput, no involvement, etc., and achieve the reduction of yield, suppression of development defects, and improvement of wettability Effect

Active Publication Date: 2010-09-15
TOKYO ELECTRON LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, if the hydrophobicity of the resist becomes high, even with this method, it may become difficult to form a uniform liquid film for the above-mentioned reasons.
In addition, in order to form a uniform liquid film in these developing methods, it is conceivable to increase the amount of developer supplied to the wafer, but the time required for the developing process will become longer, the throughput will decrease, and the cost will increase.
[0010] Patent Document 1 describes a developing device that sprays a fine mist of developer solution, but it does not deal with the above-mentioned problem, and cannot solve the problem.

Method used

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Embodiment Construction

[0044] refer to figure 1 and figure 2 , the developing device 1 for implementing the developing method of the present invention will be described. This developing device 1 is provided with a spin chuck 11 as a substrate holding portion for sucking the rear-side central portion of the wafer W to hold it in a horizontal posture. The spin chuck 11 is connected to a drive mechanism 13 via a rotation shaft 12 , and is set so that the center of the wafer W is positioned on the rotation shaft of the spin chuck 11 . In addition, the spin chuck 11 can be rotated and raised / lowered about a vertical axis while holding the wafer W by the drive mechanism 13 , and the rotation speed is controlled by a control signal output from the control unit 100 described later in the developing process.

[0045]A cup body 21 opened on the upper side is provided so as to surround the wafer W on the spin chuck 11 . The cup body 21 includes: an outer cup 22 with a quadrangular upper side and a cylindr...

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Abstract

The present invention provides a developing apparatus capable of supplying developer for a substrate highly uniformly and restraining decrease of finished products, a developing method and a storage media. The developing apparatus includes a substrate holder that holds a substrate horizontally; means for atomizing a surface treatment liquid used to improve wettability of the substrate with a developer; a first spray nozzle that sprays the atomized surface treatment liquid onto the substrate; and a developer supply nozzle that supplies a developer onto the substrate to which the substrate treatment liquid has been sprayed. The surface tension of the atomized surface treatment liquid with respect to the substrate is lower than the surface tension of the surface treatment liquid with respectto the substrate. The atomization suppresses the fact that the surface treatment liquid gathers on a certain portion of the surface of the substrate. The surface treatment liquid can be easily supplied onto the entire surface of the substrate, and improve wettability of the substrate with the developer.

Description

technical field [0001] The invention relates to a developing device, a developing method and a storage medium for developing a substrate coated with a resist on the surface and further exposed. Background technique [0002] In the photoresist process, which is one of the semiconductor manufacturing processes, a resist is applied to the surface of a semiconductor wafer (hereinafter referred to as wafer), and the resist is exposed in a predetermined pattern and then developed to form a resist pattern. Generally, such processing is performed using a system in which the application of resist, the application of development, and the development device are connected to an exposure device. [0003] This coating and developing device is provided with a developing unit (developing device) for supplying a developing solution to a wafer coated with a resist and developing the wafer. The development unit includes a substrate holding portion for holding a wafer, and a development proces...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F7/30
CPCH01L21/6715G03F7/3021G03F7/16G03F7/70925H01L21/67017H01L21/67051
Inventor 有马裕吉田勇一山本太郎吉原孝介
Owner TOKYO ELECTRON LTD
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