SEU (single event upset)/SET (single event transient)-resistant dynamic comparator
A single-event transient and dynamic comparator technology, which is applied to multiple input and output pulse circuits, can solve the problems of weakening the reinforcement effect and the influence of the storage node of the output latch circuit, and achieves reduced power consumption and the same drive capability , The effect of high-speed low-power performance
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[0021] The present invention will be described in further detail below in conjunction with the accompanying drawings.
[0022] like figure 1 As shown, the dynamic comparator includes: a pulse generating circuit 100 based on a sense amplifier structure and an output latch circuit 200, the top layer of the entire comparator has five input ports and four output ports externally, and the five input ports are respectively connected to the clock signal CLK , input signal Vin + and Vin - and the reference voltage signal Vref + and Vref - , the output port is connected to the data output signal Q0, Q1, Q2, Q3, wherein: the pulse generation circuit 100 is connected to the clock signal, the input signal, the reference voltage signal, and the output latch circuit 200; the output latch circuit 200 is connected to the pulse generation circuit 100, Data output signal connection.
[0023] The pulse generation circuit 100 includes a clock signal input terminal CLK connected to the clock ...
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