Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Conversion and calibration algorithm for improving output signal-to-noise ratio of successive approximation (SAR) analog-to-digital converter (ADC) and ADC

A technology of output signal-to-noise ratio and successive approximation, applied in the direction of analog/digital conversion calibration/test, analog-to-digital converter, etc., can solve problems such as consumption, output signal-to-noise ratio drop, multi-layout area and power consumption, etc., to achieve change The effect of small scale, low cost of hardware implementation, and simple method

Active Publication Date: 2011-05-04
东南大学无锡分校
View PDF2 Cites 40 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For high-precision applications, the input noise of the comparator becomes a non-negligible performance constraint, resulting in a decrease in the overall ADC output signal-to-noise ratio
Designing a comparator with lower input noise requires more layout area and power consumption

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Conversion and calibration algorithm for improving output signal-to-noise ratio of successive approximation (SAR) analog-to-digital converter (ADC) and ADC
  • Conversion and calibration algorithm for improving output signal-to-noise ratio of successive approximation (SAR) analog-to-digital converter (ADC) and ADC
  • Conversion and calibration algorithm for improving output signal-to-noise ratio of successive approximation (SAR) analog-to-digital converter (ADC) and ADC

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] The present invention will be described in detail below in conjunction with the accompanying drawings and specific examples. In the example, the binary weight capacitive structure is used as the realization form of DAC. However, this calibration algorithm can also be implemented for the internal DAC of the SAR ADC in the form of binary weights implemented in other ways such as resistive or resistance-capacitance hybrids.

[0018] as attached figure 1 Shown is an n-bit successive approximation analog-to-digital converter (SAR ADC) with a calibration block. calibration module with capacitor C c Together with its switching circuit, the calibration of the ADC is realized.

[0019] The conversion and calibration process of the ADC is described by simplifying the comparison and conversion process of the SAR ADC:

[0020] The sampling period:

[0021] The upper plate of all DAC capacitors is connected to Vcm, the lower plate of the DAC capacitor connected to the positive ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a conversion and calibration algorithm for improving output signal-to-noise ratio of a successive approximation (SAR) analog-to-digital converter (ADC) and the ADC. By adopting the algorithm, the overall output signal-to-noise ratio of the ADC can be effectively improved through a calibration algorithm and the ADC on the premise of not changing equivalent input noise of a comparator in the SAR ADC. In the technical scheme, the last least significant bit (LSB) cell capacitance Cc connected at a fixed potential in the traditional binary-weighted digital-to-analog converter (DAC) capacitance array is taken as the DAC capacitance of an additional period; and a comparison operation is carried out once again after the original SAR ADC comparison period is completed, and then the original ADC quantized result output is calibrated according to the obtained comparison result, thus improving the overall output signal-to-noise ratio of the ADC in the statistical sense.

Description

technical field [0001] The present invention is mainly applied to various types of analog-to-digital converters that use the principle of successive approximation to complete the conversion process to correct the output results of the converter, so as to achieve the effect of improving the overall output signal-to-noise ratio of the converter, and belongs to the calibration algorithm of the analog-to-digital converter technology field. Background technique [0002] With the rapid development of science and technology, digital signal processing technology is becoming more and more mature, and we can now use powerful, flexible and reliable digital signal processors (DSP) to complete the processing of various types of information. But the signals in the real world are all analog quantities. Before processing the analog signals in digital form, we first need to convert the analog signals into digital signals. Therefore, the analog-to-digital converter (ADC) has become an import...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03M1/10H03M1/28
Inventor 时龙兴顾俊辉张理振吴建辉赵玮胡大海叶至易张萌李红
Owner 东南大学无锡分校
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com