Short sample dense frequency signal parameter measurement method
A frequency signal and parameter measurement technology, applied in the direction of frequency measurement device, spectrum analysis/Fourier analysis, etc., can solve the problem that the excitation signal cannot last too long, the response data cannot be collected, etc., and achieve high weak signal detection ability, Estimate the effect of high efficiency and small amount of computation
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[0076] The method for measuring the parameters of the short sample dense frequency signal of the present invention will be described in detail below in combination with the embodiments and the accompanying drawings.
[0077] Such as figure 2 As shown, the parameter measurement method of the short sample dense frequency signal of the present invention, at first with the sampling frequency f s Sampling the input analog signal x(t) at equal intervals to obtain 2N-1 discrete samples x(n); performing apFFT transformation on x(n) to obtain the complex sequence X a (k), after getting its modulus value amplitude spectrum, search out spectrum peak position k=k 0 ; To shorten the frequency domain search interval, take k 0 The frequency band ω∈[(k 0-1) Δω, (k 0 +2) Δω], Δω2π / N, perform apDTFT transformation on x(n) in this frequency band, take the phase spectrum of this transformation, and observe the characteristics of its phase spectrum curve: if the phase spectrum curve presents ...
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