Mach-Zehnder point diffraction interferometer and method for reconstructing laser complex amplitudes

An interferometer, complex amplitude technology, applied in the field of optical detection, can solve the problems of limited application and large amount of calculation

Inactive Publication Date: 2011-11-02
SICHUAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the above two methods are to sample a lot of single measurement data, and then obtain the real distribution of the complex amplitude of the laser to be measured through multiple numerical iterations. Although a single measurement can be achieved, the computational complexity is large and the limitation Its applications in the fields of online measurement and real-time transient detection

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  • Mach-Zehnder point diffraction interferometer and method for reconstructing laser complex amplitudes
  • Mach-Zehnder point diffraction interferometer and method for reconstructing laser complex amplitudes
  • Mach-Zehnder point diffraction interferometer and method for reconstructing laser complex amplitudes

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Embodiment 1

[0058] In this embodiment, the structure of the Mach-Zehnder point diffraction interferometer is as follows figure 1 As shown, it includes an optical matching system 1, a first beam splitter 2, a second beam splitter 10, a first reflector 5, a second reflector 8, a first Fourier lens 3, a second Fourier lens 6, the first Three Fourier lenses 7, a fourth Fourier lens 9, a pinhole filter 4, a CCD detector 11 and a computer system 12.

[0059] The optical matching system 1 adopts a telescope system with a magnification of 4 times; the first beamsplitter 2 and the second beamsplitter 10 both use a single-wavelength beam with a transmittance-to-reflectance ratio of 5:5 for a wavelength of 632.8nm. Spectroscopic plate; the first reflector 5 and the second reflector 8 are all high reflectors for the single-wavelength dielectric film of 632.8nm wavelength; the first Fourier lens 3, the second Fourier lens 6, the first Fourier lens The three Fourier lenses 7 and the fourth Fourier len...

Embodiment 2

[0082] In this embodiment, the structure of the Mach-Zehnder point diffraction interferometer is as follows figure 1 As shown, it includes an optical matching system 1, a first beam splitter 2, a second beam splitter 10, a first reflector 5, a second reflector 8, a first Fourier lens 3, a second Fourier lens 6, the first Three Fourier lenses 7, a fourth Fourier lens 9, a pinhole filter 4, a CCD detector 11 and a computer system 12.

[0083] The optical matching system 1 adopts a telescope system with a magnification of 5 times; the first beamsplitter 2 and the second beamsplitter 10 all adopt a broadband beamsplitter flat mirror whose ratio of transmittance and reflectivity for a wavelength of 532nm is 92:8, The first reflection mirror 5 and the second reflection mirror 8 are high-reflection mirrors for the single-wavelength dielectric film of 532nm wavelength; the first Fourier lens 3, the second Fourier lens 6, the third Fourier lens 7 and the first Fourier lens The four Fo...

Embodiment 3

[0086] In this embodiment, the Mach-Zehnder point diffraction interferometer described in Embodiment 1 is used to detect the complex amplitude distribution of the He-Ne laser with a wavelength of 632.8 nm using the first method of the present invention. The steps are as follows:

[0087] (1) Through the optical device of the Mach-Zehnder point diffraction interferometer described in embodiment 1, the laser light to be measured is formed into signal light and reference light, and the signal light and reference light are overlapped and interfered to form spatial carrier frequency interference fringes ;

[0088] (2) by the CCD detector 11 of the Mach-Zehnder point diffraction interferometer described in embodiment 1, the space carrier frequency interference fringes formed by the interference of signal light and reference light are recorded in real time (the collected space carrier frequency interference fringes are as follows: figure 2 shown), and transmit the recorded interfere...

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Abstract

The invention provides a Mach-Zehnder point diffraction interferometer, comprising an optical matching system, a first optical spectroscope, a second optical spectroscope, a first reflector, a second reflector, a first Fourier lens, a second Fourier lens, a third Fourier lens, a fourth Fourier lens, a pinhole filter, a CCD (charge coupled device) detector and a computer system. A method for reconstructing laser complex amplitudes comprises the following steps: firstly, carrying out Fourier transform on collected carrier frequency interference fringes to acquire spectral distribution of the interference fringes; carrying out frequency-domain filtering to acquire zero-level frequency spectrum components and one-level frequency spectrum components, carrying out Fourier transform on one-level frequency spectrums to acquire wavefront phase distribution of lasers to be measured and amplitude modulation degree functions of the interference fringes, and carrying out Fourier transform on the zero-level frequency spectrums to acquire background light intensity of the interference fringes; and combining the amplitude modulation degree functions with the background light intensity to acquire amplitude distribution of lasers to be measured. The interferometer and the method provided by the invention are in no need of special reference light, and can be applied to detecting complex amplitudes of various lasers dynamically and evaluating light beam quality.

Description

technical field [0001] The invention belongs to the technical field of optical detection, and in particular relates to a Mach-Zehnder point diffraction interferometer and a method for reconstructing laser complex amplitude through the point diffraction interferometer. Background technique [0002] In recent years, the application of laser technology has become more and more extensive. Beam quality is an extremely critical parameter for evaluating lasers. It is generally believed that it can essentially evaluate the transmission characteristics of the output beam of the laser. extremely important. [0003] The existing beam quality parameters generally describe the static performance index of the output laser of the laser system, and do not take into account the dynamic characteristics of the output laser. For high average power lasers (such as heat capacity lasers and all-solid-state lasers), under the combined effects of thermal effects, self-acting mode fields and other ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J9/02
Inventor 冯国英杜永兆周寿桓
Owner SICHUAN UNIV
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