Device and method for measuring refractive index of intermediate infrared multi-wavelength material

Abstract

The invention discloses a device and method for measuring a refractive index of an intermediate infrared multi-wavelength material. The device comprises a laser diode, a beam shaping device, an input mirror, a laser crystal, a spherical surface high reflection mirror, a prism pair, a slit, an output coupling mirror, a Faraday isolator, a half-transparent and half-reflecting mirror, an adjustable diaphragm, a precise rotating platform, a spectrograph and a dual-channel power meter. The invention realizes direct measurement of refractive indexes of a material to be measured in a wide-spectrum range under different intermediate infrared wavelengths, solves the problem of difficulty in measurement of the refractive index of the material with intermediate infrared wavelength, and is simple andeasy in a measurement process, thus the measurement process of the refractive index is greatly simplified and the measurement cost is reduced.

Description

technical field [0001] The invention relates to the technical field of measuring the refractive index of materials, in particular to a device and a method for measuring the refractive index of materials at mid-infrared wavelengths at room temperature. Background technique [0002] At present, there are various methods for measuring the refractive index of materials, and the most commonly used methods are the V-shaped prism method and the minimum deflection angle method. Although these methods can give a relatively accurate refractive index of the material to be tested at a specific wavelength, the premise is that the material to be tested is required to have good transparency, uniformity of refractive index, and a large size. Processing accuracy also has strict requirements, and in the measurement process, some methods need to use harmful reagents to assist the measurement, so these methods have great limitations in the process of measuring the refractive index of materials....

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Problems solved by technology

[0003] In order to overcome the deficiencies in the prior art above, the present invention provides a device for measuring the refractive index of a mid-infrared multi-wavelength material and a measurement method thereof, by measuring the surface reflectance of the material to be measured at different mid-infrared wavelengths, using the Fresnel formula Calculate and obtain the precise refractive index of the material to be tested, and solve the current situation that the refractive index of various materials cannot be directly measured at mid-infrared wavelengths

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