Electrode of plasma etcher for carrying out dry etching on hard inorganic material substrate

A technology of inorganic materials and plasma, applied in the direction of circuits, discharge tubes, electrical components, etc., can solve the problems of complex structure and incapable of large-scale production, and achieve the effect of simple and reliable structure, which is conducive to large-scale production

Active Publication Date: 2013-11-27
TDG MACHINERY TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] The invention aims to solve the problem that the lower electrode of the existing ICP etching machine used for etching inorganic material substrates cannot be mass-produced and has a complex structure, and provides a dry etching hard electrode with simple structure and batch etching. Electrode of plasma etching machine for inorganic material substrate

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electrode of plasma etcher for carrying out dry etching on hard inorganic material substrate
  • Electrode of plasma etcher for carrying out dry etching on hard inorganic material substrate

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The present invention will be further described below in conjunction with specific examples, but the present invention is not limited to these specific implementations. Those skilled in the art will realize that the present invention covers all alternatives, modifications and equivalents as may be included within the scope of the claims.

[0036] refer to figure 1 , figure 2 , an electrode of a plasma etching machine for dry etching hard inorganic material substrates, including a guide rail 2 for fixed connection with an etching chamber, and a lifter that can move up and down inside the guide rail 2 is installed. A lower electrode tray is fixedly connected to the lifter 4, and the lower electrode tray is arranged above the guide rail 2, and the lower electrode tray includes a fixedly connected top plate 7 and a bottom plate 8, and the top plate 7 There is a cylindrical groove in the lower part of the cylinder, and the gas distribution plate 12 is fixedly installed in...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to an electrode of a plasma etcher for carrying out dry etching on a hard inorganic material substrate, which comprises a guide rail device for being fixedly connected with an etching cavity. A lifter capable of taking the lifting and descending motion in the guide rail device is arranged in the guide rail device. The lifter is fixedly connected with a lower electrode tray. The lower electrode tray is arranged above the guide rail device. The lower electrode tray comprises a top disk and a bottom disk which are fixedly connected. The lower part of the top disk is provided with a cylindrical groove. A gas homogenizing disk is fixedly arranged in the cylindrical groove. Gaps are reserved between the gas homogenizing disk and the top disk as well as between the gas homogenizing disk and the bottom disk. The center of the gas homogenizing disk is provided with a frist through hole for ensuring gas to be communicated to the top disk. The first through hole is communicated with a cooling gas inlet. The center of the bottom of the bottom disk is provided with a second through hole. The second through hole is isolated from the first through hole. The bottom end of the second through hole is connected with a sealed tube. The second through hole is communicated with a cooling gas outlet. The electrode has the beneficial effect that the cooling effect is good so that the etching effect is good.

Description

technical field [0001] The invention relates to an electrode of a plasma etching machine for dry etching a hard inorganic material substrate. Background technique [0002] Etching is a very important process step in semiconductor manufacturing process, microelectronic IC manufacturing process and micro-nano manufacturing process, and is a main process of patterning (pattern) processing associated with lithography. The so-called etching, in fact, is understood in a narrow sense as photolithography etching. First, the photoresist is subjected to photolithography exposure treatment by photolithography, and then the part to be removed is etched by other means. With the development of micro-manufacturing technology, in a broad sense, etching has become a general term for stripping and removing materials through solutions, reactive ions or other mechanical methods, and has become a common name for micro-machining. The simplest and most commonly used classifications of etching are...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/133H01J37/32
Inventor 平志韩苏静洪黄成强汪明刚陈波李超波
Owner TDG MACHINERY TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products