Signal operation instruction (SOI) transverse super junction power metal oxide semiconductor field effect transistor (MOSFET) device
A technology of lateral superjunction power and devices, which is applied to semiconductor devices, electrical components, circuits, etc., and can solve problems such as low withstand voltage and serious self-heating effect
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Embodiment 1
[0015] The SOI lateral superjunction power MOSFET device includes a p-type substrate 1, an insulating buried layer 2 disposed on the upper end surface of the p-type substrate 1, and a superjunction n-region 9 and a superjunction p-region 10 alternately distributed laterally. Junction structure; one side of the super junction structure is provided with a p-type body region 3; the upper end surface of the p-type body region 3 is respectively provided with an n-type source region 4, a p-type body contact region 5, and a gate oxide layer 7; n-type The upper end surface of the source region 4 and the upper end surface of the p-type body contact region 5 are jointly provided with a source electrode 6; the upper end surface of the gate oxide layer 7 is provided with a polysilicon gate 8; the other end surface of the super junction structure is provided with an n-type drain region 12; the upper end surface of the n-type drain region 12 is provided with a drain electrode 11; the upper e...
Embodiment 2
[0021] The SOI lateral superjunction power MOSFET device includes a p-type substrate 1, an insulating buried layer 2 disposed on the upper end surface of the p-type substrate 1, and a superjunction n-region 9 and a superjunction p-region 10 alternately distributed laterally. Junction structure; one side of the super junction structure is provided with a p-type body region 3; the upper end surface of the p-type body region 3 is respectively provided with an n-type source region 4, a p-type body contact region 5, and a gate oxide layer 7; n-type The upper end surface of the source region 4 and the upper end surface of the p-type body contact region 5 are jointly provided with a source electrode 6; the upper end surface of the gate oxide layer 7 is provided with a polysilicon gate 8; the other end surface of the super junction structure is provided with an n-type drain region 12; the upper end surface of the n-type drain region 12 is provided with a drain electrode 11; the upper e...
Embodiment 3
[0027] The SOI lateral superjunction power MOSFET device includes a p-type substrate 1, an insulating buried layer 2 disposed on the upper end surface of the p-type substrate 1, and a superjunction n-region 9 and a superjunction p-region 10 alternately distributed laterally. Junction structure; one side of the super junction structure is provided with a p-type body region 3; the upper end surface of the p-type body region 3 is respectively provided with an n-type source region 4, a p-type body contact region 5, and a gate oxide layer 7; n-type The upper end surface of the source region 4 and the upper end surface of the p-type body contact region 5 are jointly provided with a source electrode 6; the upper end surface of the gate oxide layer 7 is provided with a polysilicon gate 8; the other end surface of the super junction structure is provided with an n-type drain region 12; the upper end surface of the n-type drain region 12 is provided with a drain electrode 11; the upper e...
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