System for testing single particle irradiation performance of programmable logic device

Abstract

The invention discloses a system for testing a single particle irradiation performance of a programmable logic device and relates to the technology for integrated circuit testing. The system comprises a host computer, a vacuum reservoir, a particle source, at least one separation walls, at least one measuring devices and a power source. A circuit board to be tested comprises a main controller, a programmable logic device to be tested and a selectable nonvolatile memory or a random access memory. Controlling software is installed in the host computer. The system for testing the single particle irradiation performance of the programmable logic device is capable of realizing automatic operation for the process for the single particle irradiation performance test and reducing workload of test operators, is adaptive to the programmable logic devices to be tested in various different specifications, and universal.

Description

technical field [0001] The invention relates to integrated circuit testing technology, which is an integrated circuit radiation performance testing device in aerospace electronic technology. Background technique [0002] The spacecraft will be irradiated by high-energy particles and rays from space during its operation. Space radiation acts on semiconductor devices in spacecraft, which may cause device failure and failure. When space radiation acts on a semiconductor memory device, the radiation may cause the value in the memory to be erroneously flipped, and this phenomenon is called Single Event Upset (SEU). Programmable logic devices, especially field-programmable gate arrays (FPGA), as integrated circuit components containing a large number of SRAM memory cells and flip-flops, are particularly prone to single-event upsets under space radiation conditions. Therefore, it is very important to accurately measure the single event irradiation performance of FPGA chips before...

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Problems solved by technology

This increases system complexity and may affect the reliability of system operation

In addition, this method uses a camera to directly observe the digital tube on the test circuit board to judge whether the circuit is working normally. The information that can be observed by this observation method is very limited, the flexibility is low, and it is difficult to handle user logic with complex functions; Moreover, it is impossible to obtain the detailed flipping situation of the user circuit in the programmable logic device only through the camera

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