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Two-dimensional super-resolution microscopy method and apparatus

A super-resolution, two-dimensional coordinate technology, applied in the field of optical microscopy, can solve problems such as high requirements, high system cost, and inability to meet real-time detection.

Inactive Publication Date: 2013-01-09
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

STED and SIM have high requirements on system equipment, and the cost of the system is very expensive; the imaging speed of STORM and PALM is still relatively slow, which cannot meet the needs of real-time detection

Method used

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  • Two-dimensional super-resolution microscopy method and apparatus
  • Two-dimensional super-resolution microscopy method and apparatus
  • Two-dimensional super-resolution microscopy method and apparatus

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Embodiment Construction

[0087] The present invention will be described in detail below in conjunction with the embodiments and accompanying drawings, but the present invention is not limited thereto.

[0088] Such as figure 1 As shown, a two-dimensional super-resolution microscopy device includes: a first laser 1, a first single-mode fiber 2, a first collimator lens 3, a first polarizer 4, a second laser 5, and a second single-mode fiber 6. The second collimator lens 7, the second polarizer 8, the third laser 9, the third single-mode fiber 10, the third collimator lens 11, the third polarizer 12, the first phase modulator 13, the third Four lasers 14, a fourth single-mode fiber 15, a fourth collimator lens 16, a fourth polarizer 17, a second phase modulator 18, a mirror 19, a first beam splitter 20, a second beam splitter 21, The third beam splitter 22, the fourth beam splitter 23, the scanning galvanometer system 24, the scanning lens 25, the field lens 26, the microscope objective lens 27, the sam...

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Abstract

The invention discloses a two-dimensional super-resolution microscopy method. The two-dimensional super-resolution microscopy method comprises the following steps of: (1) starting a first confocal imaging mode, and collecting signal light emitted by a sample to be tested, and thus obtaining I1 (x,y); (2) starting a second confocal imaging mode, collecting signal light emitted by the sample to be tested, and thus obtaining I2 (x,y); (3) starting a first negative confocal imaging mode, and collecting signal light emitted by the sample to be tested, and thus obtaining I3 (x,y); (4) starting a second negative confocal imaging mode, and collecting signal light emitted by the sample to be tested, and thus obtaining I4 (x,y); and (5) carrying out calculation according to a formula to obtain an effective signal light intensity I (x,y), and obtaining an super-resolution image by virtue of I (x,y). The invention further discloses a two-dimensional super-resolution microscopy apparatus. The two-dimensional super-resolution microscopy method and the two-dimensional super-resolution microscopy apparatus have the advantages of high imaging speed, simple apparatus and good signal to noise ratio.

Description

technical field [0001] The invention relates to the field of optical microscopy, in particular to a two-dimensional super-resolution microscopy method and device. Background technique [0002] According to Abbe's diffraction limit theory, the limit resolution of conventional far-field optical microscope can be expressed as Where λ is the wavelength of the illumination light used, and NA is the numerical aperture of the microscope objective lens used. Therefore, in the visible light band, the resolution of optical microscopy is limited to around 200 nanometers. However, with the development of biomedical technology, researchers have begun to analyze biological tissues and cells at the nanoscale, so there must be a technology that can break through the conventional diffraction limit and achieve super-resolution microscopy. [0003] In recent years, a variety of super-resolution microscopy methods have been proposed, including: [0004] Stimulated Emission Depletion Microsc...

Claims

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Application Information

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IPC IPC(8): G01N21/64G01N21/21
Inventor 匡翠方李帅郝翔顾兆泰刘旭
Owner ZHEJIANG UNIV
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