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A Partial Field Plate Shielded High Voltage Interconnect Structure

A technology of interconnection structure and field plate, applied in semiconductor/solid-state device components, electrical components, electric solid-state devices, etc.

Active Publication Date: 2015-09-16
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a device for the adverse effect of the field plate on the surface of the device where no high-voltage interconnection line crosses over the device's lateral withstand voltage in the traditional high-voltage interconnection structure with floating field plates. High Voltage Interconnect Technology with Partial Field Plate Shielding

Method used

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  • A Partial Field Plate Shielded High Voltage Interconnect Structure
  • A Partial Field Plate Shielded High Voltage Interconnect Structure
  • A Partial Field Plate Shielded High Voltage Interconnect Structure

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Embodiment Construction

[0024] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0025] A high-voltage interconnection structure shielded by a partial field plate, used in an elliptical racetrack type lateral power device with a high-voltage interconnection line, comprising a double-layer partial polycrystalline shielded field plate and a high-voltage interconnection line; the double-layer partial polycrystalline The shielding field plate exists only in the surface layer of the device terminal area crossed by the high-voltage interconnection line, and there is no polycrystalline shielding field plate on the surface of the device crossed by the h...

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Abstract

The invention provides a high-voltage interconnection structure with a practically-screened field plate, belonging to the technical field of semiconductor power devices. The high-voltage interconnection structure is used for a runway type transverse power device with a high-voltage interconnection line, and comprises a double-layer part polycrystal screened field plate and a high-voltage interconnection line; the double-layer part polycrystal screened field plate is only stored in a surface layer of a device which is stridden by the high-voltage interconnection line, and the surface of the device which is not stridden by the high-voltage interconnection line is not provided with the polycrystal screened field plate; the double-layer part polycrystal screened field plate consists of a first-layer field plate and a second-layer field plate, wherein the second-layer field plate is arranged between the first-layer field plate and the high-voltage interconnection line; and the two layers of field plates are discontinuously distributed in the surface layer of the device, and the two layers of field plates are crisscross distributed with each other and are separated from each other by a proper distance. Compared with the conventional floating field plate structure with high-voltage interconnection, the high-voltage interconnection structure reduces the size of the device and increases the on state current capability of the device on the basis that the screen function of the floating field plate to the high-voltage interconnection line effect is not influenced, and the withstand voltage of the device is guaranteed.

Description

technical field [0001] The invention belongs to the technical field of semiconductor power devices and relates to a high-voltage interconnection structure. Background technique [0002] Power integrated circuits have made tremendous progress in areas such as communication, power management, and motor control, and will continue to receive wider attention. The integration of high-voltage devices and low-voltage control circuits in power integrated circuits brings a series of benefits, but it also poses severe challenges to circuit design. [0003] With the increase of integration and higher interconnection voltage requirements, the high voltage interconnection (High voltage Interconnection, HVI) with high potential across the lateral double diffused metal oxide semiconductor field effect transistor LDMOS (Lateral Double- Diffused MOSFET) and other high-voltage devices and the partial area on the surface of the isolation region will lead to local concentration of electric forc...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L23/528H01L23/552
CPCH01L29/7816H01L29/404
Inventor 乔明张昕许琬李燕妃周锌吴文杰张波
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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