Atomic force microscope system with quartz tuning fork

A technology of atomic force microscope and quartz tuning fork, which is applied in scanning probe microscopy, measuring devices, instruments, etc., to reduce the influence of background current, improve resolution, and improve sensitivity

Inactive Publication Date: 2013-03-27
楼柿涛
View PDF0 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, before using the atomic force microscope to observe the sample, the user must adjust multiple kno

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Atomic force microscope system with quartz tuning fork
  • Atomic force microscope system with quartz tuning fork

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings and a preferred implementation example.

[0020] refer to figure 1 , the quartz tuning fork atomic force microscope system includes an atomic force probe, a quartz tuning fork detector, a quartz tuning fork drive and detection circuit, a three-dimensional sample position controller, an atomic force microscope controller, and other equipment for the atomic force microscope.

[0021] The tip of the atomic force microscope can be made of carbon nanotubes, or it can be made of gold or tungsten wire through chemical etching, and the length is about 2 mm.

[0022] The quartz detector uses a quartz tuning fork with a resonant frequency of 32.768 kHz in the electronics. When assembling, spread the glue on the glass sheet to form a thin film, and then wipe the head of the quartz tuning fork on the glass sheet, so that the glue is glued on the head of the...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a method for controlling the distance from a needle point of an atomic force microscope to a sample by the aid of a quartz tuning fork and an atomic force microscope system with a quartz tuning fork. The atomic force microscope system is built on the basis of the method, and comprises an atomic force needle (1), a quartz tuning fork detector (2), a quartz tuning fork driving and detecting circuit (3), a three-dimensional sample position controller (4), an atomic force microscope controller (5) and other facilities of an atomic force microscope, and the other facilities of the atomic force microscope include a shock-resistant isolation component, a needle feeding motor controller (6) and the like. The quartz tuning fork driving and detecting circuit (3) comprises a signal source A and a signal source B, the amplitude of the signal source A and the amplitude of the signal source B are identical, the phase position of the signal source A is opposite to the phase position of the signal source B, the frequency and the amplitude of each signal source can be adjusted simultaneously, the signal source B is connected with a capacitor, and the signal source A is connected with the quartz tuning fork detector. The other end of the quartz tuning fork detector is connected with the other end of the capacitor and a resistor, and the other end of the resistor is grounded. Voltage difference between two ends of the resistor is amplified by an amplifier and then is outputted in a phase lock manner.

Description

technical field [0001] The invention relates to an atomic force microscope system, which is characterized in that the distance between the needle point and the sample is controlled by a quartz tuning fork. Background technique [0002] In 1986, Gerd Binning and Heinrich Rohrer of Zurich Laboratory in Switzerland developed the world's first Atomic Force Microscope (AFM). AFM enables humans to observe in real time the arrangement of single atoms on the surface of matter and the physical and chemical properties related to the surface electronic behavior. It has great significance and broad application prospects in the research of surface science, material science, life science and other fields. Its basic working principle is: use the tip on the flexible cantilever which is extremely sensitive to weak force to scan the surface of the sample, the interaction force between the tip and the sample surface makes the cantilever produce slight bending, and use the principle of optical ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01Q10/04G01Q60/24G01Q60/38
Inventor 要华
Owner 楼柿涛
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap