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Laser-induced breakdown spectroscopy overlapped peak resolution method

A technology of laser-induced breakdown and overlapping peaks, which can be used in material excitation analysis, spectrum investigation, etc., and can solve problems such as unsatisfactory results, poor measurement and calculation accuracy, etc.

Active Publication Date: 2013-05-01
SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In order to solve the shortcomings of poor measurement and calculation accuracy and unsatisfactory effects in the prior art, the purpose of the present invention is to propose a mathematical model based on a reasonable spectrum peak, and obtain the spectrum after overlapping peak resolution through unconstrained optimization algorithm calculation. Methods for peak-related information

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  • Laser-induced breakdown spectroscopy overlapped peak resolution method
  • Laser-induced breakdown spectroscopy overlapped peak resolution method
  • Laser-induced breakdown spectroscopy overlapped peak resolution method

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Embodiment Construction

[0054] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0055] Such as figure 1 As shown, the present invention is based on the spectral peak mathematical model conforming to the actual spectrum, and the workflow of the method for calculating the spectral peak related information after overlapping peak resolution through unconstrained optimization algorithm is:

[0056] Based on the mathematical model of spectral peaks that conform to the actual spectrum, the relevant information of the spectral peaks after overlapping peak resolution is calculated through an unconstrained optimization algorithm. The specific steps are as follows:

[0057] Step 1) Select the local interval segment of the spectrogram to be analyzed;

[0058] Step 2) Determine the spectral peak number N required after the spectral peak mathematical model P(x) conforming to the actual spectrum and the resolution;

[0059] Described ...

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Abstract

The invention relates to the field of laser-induced breakdown spectroscopy data pretreatment analysis. Specifically, with the method, based on a reasonable spectral peak mathematical model, with an unconstrained optimization algorithm, spectral peak related information after overlapped peak resolution is obtained by calculation. According to the method, based on a spectral peak mathematical model, and with an unconstrained optimization algorithm, spectral line related information after overlapped peak resolution is obtained by calculation, and overlapped spectral lines are separated. According to the invention, selective calculation can be carried out according to actual spectral line situations, and spectral line information can be determined with a small amount of parameters. Therefore, sample component analysis performance and accuracy are improved. Spectral peak position is visually selected, and initialization parameters needed by all optimization algorithms can be determined. The method also has the advantages of high calculation speed and easy implementation. With the method, a final processing result is selected by visual comparison, such that substance component quantitative analysis accuracy is improved.

Description

technical field [0001] The invention relates to the field of data preprocessing and analysis of laser-induced breakdown spectroscopy, and specifically relates to a method based on a reasonable mathematical model of spectral peaks and calculating and obtaining related information of spectral peaks after overlapping peak resolution through unconstrained optimization algorithms. Background technique [0002] Laser-induced breakdown spectroscopy (LIBS) is a typical atomic emission spectroscopy measurement technique. It uses a strong laser beam incident on the surface of the sample target, the sample is broken down to generate laser plasma, and the information on the type and content of elements in the sample is obtained by analyzing the atoms and ion spectral lines in the plasma. The spectrum analyzer enables the separation of the various components of the sample at different wavelength positions on the spectrogram, but due to the limited resolution of the hardware equipment, a ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/63G01J3/28
Inventor 于海斌张博孙兰香杨志家辛勇丛智博
Owner SHENYANG INST OF AUTOMATION - CHINESE ACAD OF SCI
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