A trench Schottky semiconductor device with multiple insulating layer isolation and its preparation method
A semiconductor and insulating layer technology, which is applied in the field of trench Schottky semiconductor devices, can solve the problems of multiple times, high on-resistance and reverse leakage current characteristics, so as to increase the doping concentration, reduce the forward conduction resistance,  Effect of Improving Reverse Voltage Blocking Characteristics
- Summary
 - Abstract
 - Description
 - Claims
 - Application Information
 
 AI Technical Summary 
Problems solved by technology
Method used
Image
Examples
Embodiment 1
[0035] figure 1 It is a trench Schottky semiconductor device with a variety of insulating layer isolations of the present invention, and the following combination figure 1 The semiconductor device of the present invention will be described in detail.
[0036] A trench Schottky semiconductor device with multiple insulating layers isolation, including: a substrate layer 1, which is a semiconductor silicon material of N conductivity type, and the doping concentration of phosphorus atoms is 1E19 / CM 3 , On the lower surface of the substrate layer 1, the electrode is drawn through the lower surface metal layer 11; the N-type semiconductor silicon material 2, located on the substrate layer 1, is a semiconductor silicon material of N conductivity type, and the doping concentration of phosphorus atoms is 1E16 / CM 3 ; P-type semiconductor polysilicon material 3, located on the upper part of the substrate layer 1, is a semiconductor polysilicon material of P conductivity type, and the doping co...
PUM
 Login to View More Abstract
Description
Claims
Application Information
 Login to View More - R&D
 - Intellectual Property
 - Life Sciences
 - Materials
 - Tech Scout
 
- Unparalleled Data Quality
 - Higher Quality Content
 - 60% Fewer Hallucinations
 
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com
