The Trigger Circuit Structure of IC Power Rail Antistatic Protection

An integrated circuit and electrostatic protection technology, applied in the electronic field, can solve the problems of large leakage current and high chip power consumption, achieve the effects of small leakage current, reduce trigger voltage, and improve ESD capability
CN103151350BInactive Publication Date: 2015-07-29UNIV OF ELECTRONICS SCI & TECH OF CHINA

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
UNIV OF ELECTRONICS SCI & TECH OF CHINA
Publication Date
2015-07-29
Estimated Expiration
Not applicable · inactive patent

Smart Images

  • Figure 1
    Figure 1
  • Figure 2
    Figure 2
  • Figure 3
    Figure 3
Patent Text Reader

Abstract

The invention provides a trigger circuit structure with circuit power supply rail antistatic protection, belonging to the technical field of electronics. The structure is used for triggering an integrated circuit high voltage power supply rail antistatic protective device with mixed working voltage, and comprises a series circuit, a second PMOS (positive channel metal oxide semiconductor) tube and a resistor R, wherein the series circuit consists of m (a positive integer) first PMOS tubes and is formed by connection of diodes; the source electrode of the most top first PMOS tube in the series circuit is connected with VDD_H (voltage drain drain_high); the drain electrode of the second PMOS tube is connected with a triggering end T of an ESD (electro-static discharge) protective device; the grid electrode of the second PMOS tube is connected with VDD (voltage drain drain) through the resistor R. The trigger circuit structure consists of a low voltage device, however, the trigger circuit structure can tolerate VDD_H voltage of a high voltage power supply rail, reduce the trigger voltage of the device, promote uniform conduction of the device, and improve ESD capability, and meanwhile, no capacitor device exists in the circuit, thus, the leakage current of the protected integrated circuit under normal working is smaller.
Need to check novelty before this filing date? Find Prior Art

Description

technical field

[0001] The invention belongs to the field of electronic technology, and relates to the design of an electrostatic discharge (ESD for short) protection circuit for a semiconductor integrated circuit chip, in particular to a power rail for two (or more) different voltages, and is only controlled by Electrostatic protection design technology for integrated circuits composed of low-voltage devices. Background technique

[0002] With the continuous development of CMOS technology, the number of transistors integrated on each chip has also increased dramatically. However, in a complex system, when different chips are connected to each other, since the working voltage of the chip may be different, its I / O interface circuit may need to receive or output signals of different voltage values. This requires the I / O interface circuits between chips to be able to withstand different voltages. However, for integrated circuits operating at low voltage, the gate oxide layer ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More