Semiconductor structure and forming method thereof

A semiconductor and single crystal semiconductor technology, applied in the fields of semiconductor devices, semiconductor/solid-state device manufacturing, electrical components, etc., can solve the problems of cracking of heterogeneous material films, affecting device performance, high dislocation density, etc., to relieve stress, guarantee Growth quality, low cost effect

Active Publication Date: 2013-08-14
安徽长飞先进半导体有限公司
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Problems solved by technology

[0002] In recent years, with the development of semiconductor technology, the integration of different kinds of heterogeneous materials on one substrate has attracted more and more attention. Different applications such as power semiconductor devices, optoelectronic devices, and high-speed logic devices often require different semiconductor materials, such as From the perspective of breakdown voltage, power semiconductor devices need SiC and GaN materials with large bandgap width. Optoelectronic devices need GaAs, GaN and other materials with direct bandgap semiconductors. High-speed logic devices need to use SiGe and other semico

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  • Semiconductor structure and forming method thereof
  • Semiconductor structure and forming method thereof
  • Semiconductor structure and forming method thereof

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[0031] The embodiments of the present invention are described in detail below. Examples of the embodiments are shown in the accompanying drawings, in which the same or similar reference numerals indicate the same or similar elements or elements with the same or similar functions. The embodiments described below with reference to the drawings are exemplary, and are only used to explain the present invention, but should not be construed as limiting the present invention.

[0032] In the description of the present invention, it should be understood that the terms "longitudinal", "lateral", "upper", "lower", "front", "rear", "left", "right", "vertical", The orientation or positional relationship indicated by "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, not It indicates or implies that the pointed de...

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Abstract

The invention provides a semiconductor structure and a forming method thereof. The method comprises the following steps: providing a substrate; forming a first monocrystal semiconductor layer on the substrate; etching the first monocrystal semiconductor layer to form a plurality of openings; etching the first monocrystal semiconductor layer from the plurality of openings to form a plurality of holes or slots, which extend to the top surface or the interior of the substrate; performing corrosion treatment of the substrate through the plurality of holes or slots to enable the top of the substrate to adopt a porous structure; and depositing a monocrystal semiconductor material to form a second monocrystal semiconductor layer on the first monocrystal semiconductor layer. By adopting the method, the dislocation density of a monocrystal semiconductor can be reduced, cracks caused by thermal mismatch are avoided, the growth quality of a thin film is improved, and cost reduction and substrate stripping in the later period are facilitated.

Description

technical field [0001] The invention relates to the technical field of semiconductor manufacturing, in particular to a semiconductor structure and a forming method thereof. Background technique [0002] In recent years, with the development of semiconductor technology, the integration of different kinds of heterogeneous materials on one substrate has attracted more and more attention. Different applications such as power semiconductor devices, optoelectronic devices, and high-speed logic devices often require different semiconductor materials, such as From the perspective of breakdown voltage, power semiconductor devices need SiC and GaN materials with large bandgap width. Optoelectronic devices need GaAs, GaN and other materials with direct bandgap semiconductors. High-speed logic devices need to use SiGe and other semiconductor materials. Realizing more complex functions on a chip requires high-quality heterogeneous semiconductor materials on the same substrate, and these ...

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Application Information

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IPC IPC(8): H01L21/02H01L21/20H01L29/06
Inventor 郭磊李园
Owner 安徽长飞先进半导体有限公司
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