Device and method for testing medium material radiation induction conductivity for satellite

A technology of dielectric materials and testing devices, applied in the testing field, can solve problems such as uneven dose rates, and achieve the effects of simple operation, convenient testing, and deep penetration depth

Active Publication Date: 2013-08-21
LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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  • Abstract
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Problems solved by technology

However, in the process of measuring the radiation-induced conductivity of materials by high-energy electron irradiation, due to the shallow penetration depth of electrons, there is an uneven dose rate for thicke

Method used

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  • Device and method for testing medium material radiation induction conductivity for satellite
  • Device and method for testing medium material radiation induction conductivity for satellite

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Example Embodiment

[0030] Such as figure 1 A test device for radiation-induced conductivity of a dielectric material for a satellite is shown, the device includes a shielding box 1, 60 Co irradiation source 2, vacuum system 3, upper electrode plate 4, lower electrode plate 5, dielectric material 6, sample stage 7, electrometer 8 and stabilized voltage source 9, titanium window 10, vacuum box 11;

[0031] Among them, a titanium window 10 is installed on the top of the vacuum box 11, the sample stage 7 is located inside the vacuum box 11, the dielectric material 6 is placed on the upper surface of the sample stage 7, and the upper and lower electrode plates 4 and 5 are respectively provided on the upper and lower surfaces of the dielectric material 6. The vacuum system 3 is located outside the vacuum box 11 and connected to the vacuum box 11;

[0032] A shielding box 1 is provided outside the vacuum box 11 and the vacuuming system 3 to shield the influence of gamma rays on the electrometer 8, the stabi...

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Abstract

The invention relates to a device and method for testing medium material radiation induction conductivity for a satellite, and belongs to the field of testing. The device and method for testing the medium material radiation induction conductivity for the satellite is applicable to a test on thicker medium material radiation induction conductivity in an electrification effect evaluation inside the satellite. The device comprises a shielding box body, a 60Co irradiation source, a vacuum-pumping system, an upper electrode plate, a lower electrode plate, a sample table, an electrometer, a stabilized voltage source, a titanium window and a vacuum box. The method comprises the steps of utilizing the 60Co irradiation source to generate gamma ray irradiation medium materials, meanwhile utilizing the stabilized voltage source to exert voltage on electrodes on the medium materials, testing a leakage current of the lower electrode plate through the electrometer, obtaining a voltage value V and a current value I of the surface of the medium materials, and further calculating to obtain radiation induction conductivity of the medium materials. The device and method for testing the medium material radiation induction conductivity for the satellite is applicable to the test on the thicker medium material radiation induction conductivity in the electrification effect evaluation inside the satellite.

Description

technical field [0001] The invention relates to a test device and method for the radiation-induced conductivity of dielectric materials used in satellites, which is suitable for testing the radiation-induced conductivity of thicker dielectric materials in the evaluation of satellite internal charging effects, and belongs to the field of testing. Background technique [0002] Due to the unique functions of dielectric materials, various satellites will inevitably use a large amount of dielectric materials. In the environment of space radiation irradiation, charges will be deposited inside the dielectric material, resulting in internal electrification effect, and the post-production discharge pulse will release a large amount of energy locally in the material, causing damage to satellite components and resulting in complete failure of the satellite. [0003] In recent years, the problem of electrification in spacecraft caused by space radiation environment has attracted more an...

Claims

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Application Information

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IPC IPC(8): G01R27/14
Inventor 陈益峰李得天秦晓刚杨生胜史亮柳青汤道坦王俊
Owner LANZHOU INST OF PHYSICS CHINESE ACADEMY OF SPACE TECH
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