Fast recovery diode and method for manufacturing fast recovery diode
A recovery diode and manufacturing method technology, applied in semiconductor/solid-state device manufacturing, electrical components, circuits, etc., can solve problems such as high reverse recovery voltage, adverse effects of circuits, and reverse recovery
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[0016] Please refer to figure 2 A preferred embodiment of the fast recovery diode of the present invention includes an N-type highly doped silicon substrate 111, a first N-type doped semiconductor layer 112, a second N-type doped semiconductor layer 123, and a diode anode layer 134 , the first N-type doped semiconductor layer 112 is located between the second N-type doped semiconductor layer 123 and the N-type highly doped silicon substrate 111 . Wherein the first N-type doped semiconductor layer 112 has a width of 5um to 50um and a doping concentration of 5e12 / cm 3 -5e14 / cm 3 . The doping concentration N of the second N-type doped semiconductor layer 123 D and the width d of the second N-type doped semiconductor layer 123 satisfy the formula (1):
[0017] where ε in formula (1) r is the dielectric constant of silicon, ε 0 is the dielectric constant of vacuum, e refers to the electric charge of a single electron, V R is the reverse bias voltage for normal operation, ...
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