Wavelet information redundancy based infrared image denoising algorithm

An infrared image and algorithm technology, applied in the field of infrared image information processing

Inactive Publication Date: 2013-11-20
中国兵器工业导航与控制技术研究所
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Problems solved by technology

[0006] The purpose of the present invention is to provide an infrared image denoising algorithm based on wavelet information redundancy, which can effectively solve the problem of noise amplification...

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  • Wavelet information redundancy based infrared image denoising algorithm
  • Wavelet information redundancy based infrared image denoising algorithm
  • Wavelet information redundancy based infrared image denoising algorithm

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Embodiment Construction

[0068] The preferred embodiments of the present invention will be described below in conjunction with the accompanying drawings. It should be understood that the preferred embodiments described here are only used to illustrate and explain the present invention, and are not intended to limit the present invention.

[0069] (1) Use the low-frequency filter Lo_D and the high-frequency filter Hi_D to perform wavelet decomposition on the image I(x, y), and obtain four groups of wavelet coefficients containing similar information through different down-sampling methods: subscripts ee, oe, eo respectively and oo said;

[0070] A(x,y)=Lo_D* v (Lo_D* h I(x,y)) H(x,y)=Lo_D* v (Hi_D* h I(x,y))

[0071] V(x,y)=Hi_D* v (Lo_D* h I(x,y)) D(x,y)=Hi_D* v (Hi_D* h I(x,y)) (1)

[0072] Where *h represents row convolution, and *v represents column convolution;

[0073] Then a set of wavelet coefficients is down-sampled by taking even-numbered rows and even-numbered columns, namely:

[...

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Abstract

The invention discloses a wavelet information redundancy based infrared image denoising algorithm, which is implemented through acquiring multiple sets of wavelet coefficients containing similar redundant information in a discrete wavelet transform (DWT) process respectively in different downsampling modes; carrying out nonlinear transformation on high-frequency wavelet coefficients by using noise estimation parameters as the basis of a nonlinear transformation function threshold so as to suppress high-frequency noises; then reconstituting multiple images by using converted inverse discrete wavelet transform (IDWT); and carrying out weighting by using the multiple images containing similar redundant information so as to further remove the high-frequency noises, thereby obtaining high-quality infrared images. In case that infrared image denoising processing is performed by the algorithm disclosed by the invention, the detail information of original image can be kept, and high-frequency noise of images can be removed by filtration significantly, thereby improving the image resolution; and the algorithm can be implemented by using a monolithic FPGA (Field Programmable Gate Array), thereby facilitating the implementation of miniaturization, low cost and low power consumption.

Description

technical field [0001] The invention belongs to the technical field of infrared image information processing, and in particular relates to an infrared image denoising algorithm based on wavelet information redundancy. Background technique [0002] Infrared imaging technology has good application advantages in principle. It can be used for infrared thermal guidance and night combat in the military, power monitoring and night monitoring in industry, and non-contact body temperature measurement in medicine. Infrared imaging technology has become a hot field of research nowadays. [0003] In principle, infrared imaging technology is an infrared image processing instrument or device that converts the infrared thermal radiation signal of the measured object into a two-dimensional visualized thermal image. Its output signal has the characteristics of gray concentration and low contrast, so infrared image enhancement becomes necessary. The missing means, such as the traditional his...

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Application Information

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IPC IPC(8): G06T5/00
Inventor 陈小明李玉珏邸超吕丽丽苏琮皓
Owner 中国兵器工业导航与控制技术研究所
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