Full metal sealed EMCCD camera refrigeration dewar

An all-metal, camera technology, applied in the field of photoelectric detection, can solve the problems of large leakage rate and insufficient vacuum validity period, and achieve the effect of low leakage rate and guaranteed performance

Inactive Publication Date: 2013-12-18
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
View PDF3 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These two sealing methods can meet the needs of dynamic vacuum, but for the small-volume quasi-static vacuum system of

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Full metal sealed EMCCD camera refrigeration dewar
  • Full metal sealed EMCCD camera refrigeration dewar

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0010] like figure 1 As shown, the all-metal sealed EMCCD camera cooling Dewar of the present invention is composed of a thermoelectric cooler (TEC) 1, a cold finger 2, a CCD socket 3, an EMCCD 4, a window 5, a casing 6, a copper sealing ring 7, and a base 8. The window 5, the shell 6 and the base 8 form a vacuum chamber. TEC1, cold finger 2, EMCCD4, etc. are placed in a vacuum chamber.

[0011] Firstly, the base 8 should be processed and the welding of the window 5 and the shell 6 should be completed. like figure 2 , the main body of the base 8 is copper, and the electrodes 10 are welded through ceramics. The electrode 10 is a communication channel between the inside of the chamber and the outside. At the same time, an oxygen-free copper tube 9 is also welded on the base 8 . After the base processing is completed, leak detection is required to detect the leakage rate of the weld. The window 5 and the housing 6 are welded by anodic welding. After the welding is complete...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A full metal sealed EMCCD(Electron Multiplication Charge Coupled Device) camera refrigeration dewar comprises a thermoelectric cooler(TEC), a cold finger, a CCD socket, an EMCCD, a window, an outer shell, a copper seal ring and a base. A full metal sealed vacuum cavity is formed by the window, the outer shell and the base, the window and the outer shell are welded through anode welding, the outer shell and the base are sealed through knife edge flanges, the TEC, the cold finger, the EMCCD and the like are placed in the vacuum cavity, and the TEC serves as a cold source of a system. The interior of the vacuum cavity is vacuated, heat exchange between the EMCCD and the external environment is reduced to the minimum though the vacuum environment in the cavity, and thus the refrigeration effect is guaranteed. The system is suitable for the field of EMCCD camera refrigeration.

Description

technical field [0001] The invention belongs to the field of photoelectric detection, and relates to a cooling dewar for an all-metal sealed EMCCD camera. Background technique [0002] EMCCD (Electron Multiplication Charge Coupled Device, EMCCD) has two characteristics of high sensitivity and high frame rate, and has broad application prospects in astronomical observation, biomedicine, scientific research, industrial production and other fields. Two key factors affecting the EMCCD signal-to-noise ratio: dark current noise and electron multiplication gain are both related to the operating temperature of the EMCCD. The lower the operating temperature of the EMCCD, the smaller the dark current noise, the larger the electron multiplication gain, and the higher the signal-to-noise ratio. Therefore, the cooling system for EMCCD is an essential part of EMCCD camera. [0003] The life of the vacuum seal is the most critical factor affecting the performance of the cooling system of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): H01L27/148F25D3/10
Inventor 何凯马文礼王明富汪旋
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products