Method for measuring semitransparent material radiation characteristics by adoption of multi-frequency modulation laser heating and photo-thermal information reconstruction technology

A technology of translucent materials and laser modulation, which is applied in the direction of material analysis, measuring devices, and analyzing materials through optical means, and can solve the problems of complex measurement systems and low measurement accuracy

Active Publication Date: 2014-01-22
HARBIN INST OF TECH
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Problems solved by technology

[0004] In order to solve the problems of complex measurement system and low measurement accuracy in the existing methods of measuring the attenuation coefficient and albedo of translucent materials, the present invention proposes a radiation characteristic of translucent materials using multi-frequency modulation laser heating and photothermal information reconstruction technology Measurement methods

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  • Method for measuring semitransparent material radiation characteristics by adoption of multi-frequency modulation laser heating and photo-thermal information reconstruction technology
  • Method for measuring semitransparent material radiation characteristics by adoption of multi-frequency modulation laser heating and photo-thermal information reconstruction technology
  • Method for measuring semitransparent material radiation characteristics by adoption of multi-frequency modulation laser heating and photo-thermal information reconstruction technology

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specific Embodiment approach 1

[0025] Specific Embodiments 1. The method for measuring the attenuation coefficient and albedo of translucent materials using multi-frequency modulation laser heating and photothermal information reconstruction technology described in this embodiment, the specific operation steps of the method are:

[0026] Step 1. Make the translucent material to be tested into a flat specimen with a thickness of L, adjust the position of the laser so that it is aligned with the left center of the specimen, and the incident direction of the laser is perpendicular to the left surface of the specimen. Only thermocouple probes are fixed on the left and right sides of the specimen;

[0027] Step 2. Set the laser frequency of the sinusoidal laser source with adjustable amplitude as ω 1 , turn on the laser light source to heat the left surface of the specimen, and at the same time use the photodetector to measure the frequency-domain hemispherical reflection radiation signal of the laser incident s...

specific Embodiment approach 2

[0038] Specific Embodiment 2. This embodiment is a further description of the attenuation coefficient and albedo measurement method of translucent materials using multi-frequency modulation laser heating and photothermal information reconstruction technology described in specific embodiment 1. The method described in step 4 The algorithm of the inverse problem is realized by the improved simulated annealing-stochastic particle swarm algorithm (SA-SPSO).

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Abstract

The invention discloses a method for measuring semitransparent material radiation characteristics by the adoption of a multi-frequency modulation laser heating and photo-thermal information reconstruction technology, and relates to a method for measuring semitransparent material radiation characteristic parameters. The method comprises the steps that lasers with different frequencies are used for radiating one side surface of a semitransparent material, a photoelectric detector is used for measuring frequency domain hemispherical reflection radiation signals of the laser incidence side of the material at the incidence laser frequency and frequency domain hemispherical transmission radiation signals on the laser emergent side of the material at the incidence laser frequency respectively, and a thermocouple thermodetector is used for measuring and recording changes of the temperatures on the two surfaces of the material along with time. According to the frequency domain hemispherical reflection radiation signals, the frequency domain hemispherical transmission radiation signals and the temperatures, changing along with time, of the two surfaces and through an inverse problem solution technology, the attenuation coefficient of the semitransparent material and the albedo of the semitransparent material are obtained. According to the method, a direct problem model and an inverse problem model for measuring the attenuation coefficient of the semitransparent material and the albedo of the semitransparent material are established and meanwhile the attenuation coefficient of the semitransparent material and the albedo of the semitransparent material can be measured simply, quickly and accurately by the utilization of the inverse problem solution technology.

Description

technical field [0001] The invention relates to a method for measuring attenuation coefficient and albedo of translucent materials using multi-frequency modulation laser heating and photothermal information reconstruction technology, belonging to the technical field of radiation characteristic parameter measurement of translucent materials. Background technique [0002] Translucent materials refer to materials whose spectral optical thickness is limited in one or several wavelength ranges. It has important applications in many fields such as aerospace, military, energy, chemical industry and biomedicine. [0003] Attenuation coefficient and albedo are important radiation characteristic parameters that characterize the radiative transmission characteristics of translucent materials. It has important application value in flaw detection and other fields. Therefore, it is of great significance to accumulate the radiation characteristic parameter data of various translucent mat...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/17
Inventor 齐宏牛春洋宫帅阮立明
Owner HARBIN INST OF TECH
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