Device and method for testing colors of colored CCD chip

A color measurement and color technology, applied in the field of optical measurement, can solve the problems of inconvenience and inability to evaluate the color quality of CCD imaging, and achieve the effect of easy selection.

Inactive Publication Date: 2014-02-19
XIDIAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The performance parameter indicators provided by color CCD manufacturers are only some basic parameters, such as responsivity, signal-to-noise ratio, dark current, etc., without mentioning color information, so it is impossible to evaluate the quality of color in CCD imaging. inconvenient to use

Method used

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  • Device and method for testing colors of colored CCD chip
  • Device and method for testing colors of colored CCD chip
  • Device and method for testing colors of colored CCD chip

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Embodiment Construction

[0034] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0035] refer to figure 1 , The measurement system of the present invention includes: xenon light source 1, monochromator 2, attenuator 3, integrating sphere 4, darkroom 5, Dewar temperature control room 6, drive control circuit 7 and host computer 8. Among them: the spectral range of the xenon light source 1 is 200nm-2500nm, and the power is 500 watts; the output spectral resolution of the monochromator 2 is 1nm and can be continuously adjusted; the resolution of the attenuator 3 is not lower than 1nm, and the attenuation is between 1nm and 20dB, full range continuously adjustable; the diameter of the integrating sphere 4 is a 20-inch diffuse reflection sphere, the inlet diameter is 2 inches, the outlet diameter is 4 inches, the inner surface is coated with Spectralon, and the radiation uniformity is >98%; the darkroom 5 is rectangular The cavity is made of ...

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Abstract

The invention discloses a device for testing colors of a colored CCD chip. The device mainly solves the problem that an existing testing device can not accurately judge color quality of the colored CCD chip. The device comprises a xenon lamp light source, a monochrometer, an attenuator, an integrating sphere, a dark room, a Dewar bottle temperature control chamber, a drive control circuit and an upper computer. A colored CCD chip to be tested is placed in the Dewar bottle temperature control chamber and is connected with the drive control circuit. The monochrometer generates monochrome light and three-primary color light through irradiation of the xenon lamp light source and parameter adjustment, after the monochrome light and three-primary color light are converted to uniform face array light through the integrating sphere and the dark room, the light irradiates the colored CCD chip to be tested, and rgb brightness values of an image are obtained through the drive control circuit and the upper computer. The image is transferred to an L*a*b* space from an rgb space, and color quality of the colored CCD chip to be tested is judged according to the magnitude of the Euclidean distance between a point to be tested and a standard point in the L*a*b* space. The device has the advantages of being high in adaptability and stability, accurate in measurement of color brightness values, and capable of being used for quality selection of colored CCD chips.

Description

technical field [0001] The invention belongs to the field of optical measurement, in particular to a color testing device and method for a color CCD chip, which is used for evaluating the quality of the color CCD. Background technique [0002] Charge-coupled device CCD is a new type of semiconductor device developed in the early 1970s. It receives the light radiation energy reflected from the surface of the object or emitted by itself, and records the surface visual information of the object. As an important photoelectric detection element, CCD's various performance parameters determine the performance of the detection system to a large extent. Therefore, when developing a detection system, it is necessary to select a CCD chip with appropriate performance parameters. [0003] At present, CCD is mainly used in the following aspects in China. 1. Measurement testing, mainly including length measurement, thickness measurement, and level measurement. 2. Optical information proc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N17/00H04N17/02
Inventor 王琳徐军王旭邵晓鹏孙昊洋石慧明
Owner XIDIAN UNIV
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