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A device for bonding quartz tuning fork probes

A quartz tuning fork and bonding technology, applied in measuring devices, scanning probe technology, scanning probe microscopy, etc., can solve problems such as the destruction of the needle-tip quartz tuning fork and the difficulty of bonding tungsten needle points, so as to improve the success rate and performance Reliable, easy-to-operate effect

Inactive Publication Date: 2015-09-09
BEIHANG UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, it is very difficult to directly bond the tungsten needle tip on the tuning fork arm by hand, and a little carelessness will cause damage to the needle tip or the quartz tuning fork

Method used

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  • A device for bonding quartz tuning fork probes
  • A device for bonding quartz tuning fork probes
  • A device for bonding quartz tuning fork probes

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Embodiment Construction

[0036] The present invention will be further described in detail below in conjunction with the accompanying drawings.

[0037] see figure 2 As shown, the A needle point 5C of the quartz tuning fork probe is bonded to the end surface of the A tuning fork arm 5A, and the B needle point 5D is bonded to the end surface of the B tuning fork arm 5B, and the tips of the A needle point 5C and the B needle point 5D are kept on the same axis . The needle points (A needle point 5C, B needle point 5D) can be designed into a tapered structure. The tip 5C2 of the A tip 5C is in contact with the sample. The tip material is tungsten wire. The quartz tuning fork 5 is a double-arm quartz tuning fork, a K-3×8 or K-2×6 lead-type crystal resonator produced by Beijing Kaiqing East Optoelectronics Co., Ltd.

[0038] see image 3 , Figure 3A As shown, the device for bonding the quartz tuning fork probe designed by the present invention includes a Z-axis column 1, a Y-axis limiting plate 2, a ...

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Abstract

The invention discloses a device for bonding a quartz tuning fork probe. Mounting holes which are at equal intervals and has the same diameter in the X axial direction and the Y axial direction are formed in a limiting base in the device. A first base, a second base, a Z-axis stand column and a magnifying glass support are mounted on the limiting base. The Z-axis stand column is provided with a Y-axis limiting plate. The first base is provided with a two-degree-of-freedom adjusting piece, a pressing plate stand column is mounted on the two-degree-of-freedom adjusting piece, and a pressing plate is mounted on the pressing plate stand column. An X-axis adjusting piece is mounted on the second base, a Z-axis supporting seat is mounted on the X-axis adjusting piece, the Z-axis supporting seat 7 is provided with a Z-axis adjusting piece, and the Z-axis adjusting piece is provided with a quartz tuning fork fixing frame. The magnifying glass support is provided with a magnifying glass. According to the device for bonding the quartz tuning fork probe, a precision displacement adjusting mechanism is used for controlling displacement of a quartz tuning fork and a probe tip, a manual manufacturing process is replaced, the bonding successful rate is improved, and the performance of the manufactured quartz tuning fork probe is reliable.

Description

technical field [0001] The invention relates to a glue bonding processing machine, more particularly, a device for bonding a quartz tuning fork probe. Background technique [0002] In 1986, Binnig and Quate invented the Atomic Force Microscope (AFM). The atomic force microscope uses a very thin needle tip to detect the sample surface point by point. When the distance between the needle tip and the sample surface reaches the nanometer level, the probe will be subjected to the interaction force generated by the sample. superficial information. Through the combination with a variety of modern technologies, the atomic force microscope has not only become one of the microscopes with the highest resolution in the world, but also can perform nanoscale resolution imaging of samples in vacuum, atmosphere and liquid environments, and has nanomanipulation and assembly capabilities. , A powerful microscopic surface analysis instrument that can measure forces as small as pN. At presen...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01Q60/38
Inventor 李英姿李进钱建强张维然张立文王振宇
Owner BEIHANG UNIV
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