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Ultrahigh-resolution non-linear optical microscopy system

A nonlinear optics and ultra-high-resolution technology, applied in the field of ultra-high-resolution nonlinear optical microscopy systems, which can solve the problems of poor optical penetration, inability to meet various needs, and difficult to achieve biological living tissue imaging. , to achieve the effect of being less affected by scattering and improving penetration

Inactive Publication Date: 2014-06-11
TIANJIN UNIV
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  • Claims
  • Application Information

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Problems solved by technology

One of the bottlenecks encountered in the development of ultra-high resolution optical microscopy is that it is difficult to image living tissues
The essence is that these microscopic methods are based on single-photon excitation fluorescence technology, which has poor optical penetration and cannot meet various needs in practical applications.

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Embodiment Construction

[0024] In order to make the purpose, technical solution and advantages of the present invention clearer, the implementation manners of the present invention will be further described in detail below.

[0025] Nonlinear optics uses infrared lasers with longer wavelengths as multiphoton excitation light sources, which are less affected by scattering and have a higher penetration depth, so tomographic imaging of living biological tissues can be realized. The combination of nonlinear optics and stimulated emission subtraction microscopy (STED) can realize ultra-high resolution imaging of thick tissues in vivo. The principle of STED is to reduce the diffraction area of ​​the fluorescent light spot through two laser beams. The first laser beam is used to excite fluorescent molecules, and the second laser beam quenches the fluorescence at the periphery of the focal point of the excitation spot, and only the center of the focal point can detect fluorescence. In this way, the resoluti...

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Abstract

The invention discloses an ultrahigh-resolution non-linear optical microscopy system, and relates to the field of laser detection. According to the system, a non-linear optical technique and a stimulated emission depletion microtechnique are combined, a beam of short pulse infrared laser is used as a multi-photon stimulated light source, another beam of super-short laser pulse of a wide tuning range, which is generated from a synchronous short pulse laser pumping frequency doubling pumping light parameter oscillator, is expanded to be 200ps in pulse width by virtue of a single-mode optical fiber; as a stimulated emission depletion light source, the stimulated light is used for stimulating fluorescent molecules; the fluorescence at the periphery of a stimulated light spot focus is quenched by virtue of the stimulated emission depletion light, and then the non-linear optical microscopy system can break through the light wave diffraction limit. According to the system, in the non-linear optics, infrared laser with long wavelength is used as the multi-photon stimulated light source with high penetration depth because of small scattering influence, and ultrahigh resolution tomography imaging of a living organism tissue is facilitated.

Description

technical field [0001] The invention relates to the field of laser detection, in particular to an ultra-high resolution nonlinear optical microscope system. Background technique [0002] The spatial resolution of far-field optical microscopy has been limited by the diffraction limit. Due to its wave characteristics, light waves will be diffracted, so the beam cannot be infinitely focused. 200nm is the theoretical resolution limit of the far-field optical microscope. With the rapid development of life sciences, the research has penetrated into the level of single cell, sub-cell and single molecule, and the spatial resolution of optical microscope has become the most critical core issue. [0003] Although near-field scanning optical microscopy (Near-field Scanning Optical Microscopy, NSOM) breaks through the diffraction limit, is no longer limited by light waves, and the resolution can reach the nanometer level, but it is only suitable for two-dimensional high-resolution meas...

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Application Information

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IPC IPC(8): G02B21/06
Inventor 李奇峰陈达沙乾坤王洋
Owner TIANJIN UNIV
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