High-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement device and method

A high-precision synchronization and laser ranging technology, applied in measuring devices, radio wave measuring systems, using re-radiation, etc., can solve problems such as lack, achieve increased flexibility, improve measurement efficiency and accuracy, and overcome the indirectness of measuring rulers. The effect of traceability

Active Publication Date: 2014-09-10
HARBIN INST OF TECH
View PDF9 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] The purpose of the present invention is to solve the problem that the current phase laser ranging technology lacks a laser ranging device and method that can take into account high power, multi-scale synchronization and traceability, and to provide a high-precision synchronization based

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement device and method
  • High-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement device and method
  • High-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] Embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0034] A semiconductor laser ranging device based on high-precision synchronous multi-measurement rulers, including a beam expander collimator mirror group 3, the device is composed of a ruler generation unit 1, a laser frequency shift unit 2, a beam expander collimator mirror group 3 and a measurement Composed of optical path and circuit unit 4, the laser emitted by the measuring ruler generating unit 1 is output to the input end of the laser frequency shifting unit 2, and a laser output from the laser frequency shifting unit 2 is output to the measuring optical path and circuit unit through the beam expanding collimating lens group 3 4, another laser output from the laser frequency shifting unit 2 is directly input to the other input end of the measurement optical path and circuit unit 4;

[0035] The structure of the measuring ruler generation unit ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a high-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement device and method and belongs to a phase laser distance measurement technology. The high-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement device comprises a measuring ruler generation unit, a laser frequency shifting unit, a beam expanding collimation lens group and a light path and a circuit measurement unit. The high-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement method comprises step 1, opening a frequency standard laser and a semiconductor laser; step 2, serving one beam as a reference laser beam and serving the other beam as a measurement laser beam; step 3, serving a formula as an accurate measurement ruler; step 4, serving a formula as a rough measurement ruler; step 5, moving a measurement prism to a target side to obtain the phase difference Phi 1 of the rough measurement ruler and the phase difference Phi 2 of the accurate measurement ruler and obtaining a measured distance value through a formula. According to the high-accuracy synchronous multi-measurement-ruler based semiconductor laser distance measurement device and method, the problem that the multi-measurement-ruler synchronicity and traceability of devices and methods cannot be integrated in the phase laser distance measurement technology is solved, the accuracy of distance measurement is high, the measurement efficiency is high, and the stability and the real-time performance are high.

Description

technical field [0001] The invention belongs to phase laser measurement technology, and mainly relates to a phase laser distance measuring device and method. Background technique [0002] Large-scale measurement has attracted much attention in the development of large-scale precision machinery manufacturing, major scientific and technological projects, aerospace industry, shipbuilding industry and microelectronic equipment industry and other large-scale optical-mechanical-electrical integration equipment processing and manufacturing. It is an important basis for the processing and overall assembly of large parts in aerospace vehicles and giant ships. The quality of its measurement methods and equipment performance directly affect the quality of workpieces and assembly accuracy, which in turn affects the operating quality, performance and life of the entire set of equipment. The multi-ruler phase ranging method uses a group of measuring ruler wavelengths from large to small t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01S11/12
CPCG01S11/12
Inventor 谭久彬杨宏兴胡鹏程
Owner HARBIN INST OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap