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an electron ionization source

An electron ionization and electron source technology, applied in the field of mass spectrometry, can solve problems such as low ion transmission efficiency, and achieve the effect of improving ion extraction efficiency and sensitivity

Active Publication Date: 2017-12-15
FOCUSED PHOTONICS +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The electric field simulation of the ion box on the current commercial mass spectrometer is carried out by the ion optics simulation software. It shows that due to the small opening of the ion box, it is difficult for the external lens to affect the electric field inside the ion box, and the electric field inside the ion box is mainly repelled. The ion optics simulation shows that most of the ions hit the wall of the ion box, and only a small part of the ions (only 40%) can enter the lens group of the ion source through the small hole, and the ion transmission efficiency is low.

Method used

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  • an electron ionization source

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Embodiment

[0017] figure 1 Schematically provides a cross-sectional view of the electron ionization source of the embodiment of the present invention, as figure 1 As shown, the electron ion source includes:

[0018] Electron source, repelling electrode 12, ion lens 15;

[0019] The first cylindrical part 11, the electron source is arranged on the side of the first cylindrical part; the repeller electrode is arranged in the first cylindrical part with openings at both ends;

[0020] Annular part 13, said annular part is arranged on one side of said first cylindrical part, wherein the side away from said first cylindrical part is a flat plate, the center of the flat plate has an ion outlet, the hollow inside of said annular part The inner diameter along the direction of ion exit gradually shrinks, and the hollow part is in the shape of a cone;

[0021] The second cylindrical part 14, the second cylindrical part is arranged in the outlet; the ion lens is arranged on one side of the secon...

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Abstract

The invention provides an electron ionization source, including an electron source, a repulsion electrode and an ion lens, and further including a first cylindrical component, an annular component and a second cylindrical component, wherein the electron source is arranged at the side part of the first cylindrical component, the repulsion electrode is arranged in the first cylindrical component with two open ends, the annular component is arranged on one side of the first cylindrical component, one side, far away from the first cylindrical component, of the annular component is provided with an outlet, and the inner diameter of the hollow inner part of the annular component is gradually reduced along the emitting direction of ions, the second cylindrical component is arranged in the outlet, and the iron lens is arranged on one side of the second cylindrical component along the emitting direction of the ions. The electron ionization source has the advantage of being high in ion emitting efficiency.

Description

technical field [0001] This invention relates to mass spectrometry and, in particular, to electron ionization sources. Background technique [0002] Gas chromatography-mass spectrometry instrument is one of the important members in the field of analytical instruments. The mixed organic molecules enter the mass spectrometer after being separated by the gas chromatography column. The mass spectrometer ionizes the organic molecules and makes various ions under the action of electric field or magnetic field. Separation is carried out according to the mass-to-charge ratio, and the corresponding intensity is detected. The obtained mass spectrum signal can be used for qualitative identification and quantitative analysis of substances. [0003] The ion source of the gas chromatography-mass spectrometry instrument is mainly an electron ionization source (EI). The EI source is composed of a semi-closed ion box and a set of lenses. In the ion box, there is a filament at both ends of t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/10H01J49/04
CPCH01J49/147
Inventor 吴先伟刘立鹏邓丰涛韩双来郑毅
Owner FOCUSED PHOTONICS
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