Photoelectric detector service life assessment test system

Abstract

The invention provides a photoelectric detector service life assessment test system and aims at providing an assessment test system which can automatically monitor and collect data in real time and can simultaneously exert three kinds of freely combined stress on a detector for service life test. The photoelectric detector service life assessment test system is realized through the following technical scheme that pulse optical signals from a semiconductor laser are distributed to each photoelectric detector tested sample by an optical control test system via an optical fiber splitter; a temperature control system carries out temperature control on tested samples arranged in each region of a test tooling through a temperature test box; a power supply control system respectively carries out control according to the voltage of each region of the test tooling through a power supply control module, a test monitoring system controls the tested samples of different regions through a control panel, the parameters of the tested samples are monitored in real time, the real-time collection on the sample parameter test data is realized, the normal state of the tested samples is monitored, collected information is transmitted to a computer through an FPGA (field programmable gate array) module, and service life and confidence degree parameter assessment is carried out.

Description

technical field [0001] The invention relates to a test system for photoelectric detector life, in particular to a test system for evaluating the life of a silicon avalanche photodetector. Background technique [0002] Photodetector is the key component of laser detection and laser ranging, and its performance directly affects the ability of remote sensing system information detection. With the continuous improvement of space remote sensing applications for the detection target's band characteristics, spatial resolution, radiation resolution, time resolution, and reliability, photodetectors, as the core components of space remote sensing instruments, need to expand the wavelength range and improve Optoelectronic performance, improvement of spectral shape, reduction of photosensitive element size, increase of device scale, improvement of lifetime and reliability, etc. The reliability and lifespan of the photodetector is an important link to ensure the working life of the whol...

AI Technical Summary

Problems solved by technology

However, long-term storage and work tracking are difficult to achieve in actual work, especially after the upgrading of new materials and new technologies, the referenceability of work and storage data of similar products has largely lost its reference significance

In the existing technology, due to the lack of understanding of the life law of silicon avalanche photodetectors, the work of determining and prolonging the life of new photodetector products has lost a credible quantitative basis, thus seriously affecting the reliable storage and reliable use of weapons and equipment protection, which greatly increases the risk of equipment users

[0004] In the existing life evaluation test, the single stress life test of the photoelectric detector is relatively easy to realize, but in the storage and operation of the photodetector, especially in the work, it is often affected by various stresses, and the single stress life test cannot be true. Therefore, the single-stress life test has very limited guiding significance for the actual work. The multi-stress life test is an inevitable trend in the development of life evaluation of photoelectric detectors.

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