Method for realizing programmable multi-wave lateral shearing interferometer
A technology of transverse shearing and interferometer, applied in the direction of instruments, scientific instruments, measuring devices, etc., can solve the problems of diffraction efficiency error, interferometer flexibility and accuracy limitation, grating shape immutability, etc.
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Embodiment 1
[0066] Generation of a Diffraction Grating for a Four-Wave Transverse Shear Interferometer Using a Phase-Pure Liquid Crystal Spatial Light Modulator. Its light path schematic diagram is as figure 2 As shown, LCM: Liquid-crystal spatial light modulator, performs Fourier transformation and inverse transformation on the interference fringe pattern detected by CCD to obtain the wavefront slope information of the measured light in four directions, and restores the wavefront through the wavefront slope .
Embodiment 2
[0068] Generation of a Diffraction Grating for a Six-Wave Transverse Shear Interferometer Using a Phase-Pure Liquid Crystal Spatial Light Modulator. Its light path schematic diagram is as image 3 As shown, an annular diaphragm is placed on the focal plane of the 4f system, so that six beams of first-order diffracted light pass through the system. These six beams of first-order diffracted light are coherently superimposed on the observation surface to form interference fringes. Fourier transform and inverse transformation are performed on the interference fringe pattern detected by the CCD to obtain the wavefront slope information of the measured light in eight directions. Front slope restores the wavefront.
Embodiment 3
[0070] Generation of a Diffraction Grating for a Three-Wave Transverse Shear Interferometer with a Phase-Pure Liquid Crystal Spatial Light Modulator. Its light path schematic diagram is as Figure 5 As shown, a diaphragm is placed on the focal plane of the 4f system, so that three beams of first-order diffracted light pass through the system. The three beams of first-order diffracted light are coherently superimposed on the observation surface to form interference fringes. Fourier transform and inverse transform are performed on the interference fringe pattern detected by the CCD to obtain the wavefront slope information of the measured light in three directions. Front slope restores the wavefront.
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