Device and method for measuring high-frequency microwave field strength based on electromagnetically induced transparency effect

An electromagnetically induced transparency and high-frequency microwave technology, which is applied in the fields of electromagnetic field characteristics, color/spectral characteristic measurement, material excitation analysis, etc., can solve the problems of limited measurement frequency range and low measurement accuracy, and achieve simple and stable structure, high sensitivity, small perturbation effect

Active Publication Date: 2017-09-26
SHANXI UNIV
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Problems solved by technology

[0003] The present invention provides a device and method for measuring high-frequency microwave field strength based on the electromagnetically induced transparency effect in order to solve the technical problem that the current traditional microwave measurement technology is limited in the measurement frequency range and the measurement accuracy is not high.

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  • Device and method for measuring high-frequency microwave field strength based on electromagnetically induced transparency effect
  • Device and method for measuring high-frequency microwave field strength based on electromagnetically induced transparency effect
  • Device and method for measuring high-frequency microwave field strength based on electromagnetically induced transparency effect

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Embodiment Construction

[0023] A device for measuring high-frequency microwave field strength based on the electromagnetically induced transparency effect, including a first-step excitation laser 1, a second-step excitation laser 2, and a sample filled with sample atomic vapor inside and equipped with a fiber-optic coupling head at both ends of the outside pool 4; the first step is to excite the exit end of laser 1 connected to fiber modulator 3 through optical fiber; the exit end of fiber modulator 3 is connected to a fiber coupling head of sample pool 4 through optical fiber; the second step is to excite the exit end of laser 2 A fiber coupling / beam splitter 5 is connected through an optical fiber; one exit end of the fiber coupling / beam splitter 5 is connected with another fiber coupling head of the sample cell 4 through an optical fiber; the other exit end of the fiber coupling / beam splitter 5 Connect with photodetector 8 by optical fiber; Also comprise reference signal source 6, a signal output e...

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Abstract

The invention relates to a surface weak high-frequency microwave field strength measurement technology, and in particular relates to a device and a method for measuring high-frequency microwave field strength based on an electromagnetic induction transparent effect. The device and the method are technically characterized in that high-sensitivity and high-accuracy detection for the surface weak microwave field strength can be realized by a specially designed sample absorption cell structure, and atomic line splitting is associated with the microwave field strength by a quantum coherent effect of Rydberg state atoms, so that the measurement of the microwave field strength is traced back to the frequency standard of an atomic transition line, and the self-calibration of the device can be realized by utilizing the linear relation of the microwave field strength and the frequency standard of the atomic transition line; furthermore, due to the high-sensitivity response of high Rydberg state to the weak microwave field, the detection sensitivity of the high-frequency microwave field reaches up to 0.1mV / m and even reaches up to 10mV / m. Furthermore, the whole detection device is high in stability of structure and small in microwave turbulence.

Description

technical field [0001] The invention relates to a technique for measuring surface weak high-frequency microwave field strength, in particular to a device and method for measuring high-frequency microwave field strength based on the electromagnetically induced transparency effect. Background technique [0002] Microwave measurement is a measurement technique for the relevant parameters of microwave signals, and the main measurement objects are: power, frequency or wavelength. The methods pioneered by Hertz for measuring microwave fields and the standards for calibrating equipment have changed little since 1880. Accurate measurement of microwave electric field strength is the key to RF signal design, and it has wide applications in avoiding interference between digital devices, ensuring the safety of people near radio devices, and calibrating existing sensors and test equipment. In traditional microwave measurement, the size of the microwave equipment is similar to the microw...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/08G01N21/31G01N21/63
Inventor 张临杰杨文广赵建明贾锁堂
Owner SHANXI UNIV
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