A pass-through test device for a low-power differential transmission chip

Abstract

The invention discloses a test device for a low-power differential transmission chip, which includes a plug-in side interface, a test system-side interface, a differential solution chip set, and a clock circuit; the plug-in side interface and the test system side interface pass through and The running lines are directly connected one-to-one and communicate bidirectionally; the differential solution chip set is connected one-to-one with the interface on the plug-in side through differential wiring and communicates in one direction, and is connected one-to-one with the interface on the test system side through parallel lines and one-way communication; the clock circuit is connected with the differential chip set. The invention has the advantages that: the device has simple structure, compact wiring, uses mature chips and electronic components, has extremely low purchase cost and good portability.

Description

technical field [0001] The invention relates to the field of circuit testing, in particular to a through testing device for low power consumption differential transmission chips. Background technique [0002] Electronic devices widely used in the industrial field are becoming more automated and intelligent, but due to the large number of low-power differential transmission chips, such as DS90CR285 and DS90CR286 chips, it is difficult to locate these electronic devices when there is a transmission failure If the fault point, especially the short circuit of the fine-pitch pins, cannot be found by naked eyes, it can only be solved by replacing a new chip, which will increase the debugging cost and reduce the reliability of the circuit board. [0003] In such cases, it is important to be able to accurately test low-power differential transmission chips. However, most existing devices for testing differential transmission rely on the entire system. By designing FPGA test logic, ...

AI Technical Summary

Problems solved by technology

However, most existing devices for testing differential transmission rely on the entire system. By designing FPGA test logic, connecting corresponding chips one by one through LVDS (Low Voltage Differential Signaling) cables, and then checking chip failures with an oscilloscope, this This method is not only time-consuming and labor-intensive, but also has a very narrow scope of use

In addition, with the development of equipment and electronic technology, the types of interfaces are constantly being upgraded and improved, so the method of simply designing FPGA test logic cannot well solve the general problem of low-power differential transmission chip testing

Finally, the complex wiring interface and hardware wiring mode will also make it difficult to develop test programs, which will affect the use of

Images