Method for testing single event effect of on-chip system

A single-event effect, system-on-chip technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of complex measurement methods, no unified test method for single-event effect testing, and complex error types, and achieve data processing. The effect of convenient, convenient and quick detection and high degree of automation

Inactive Publication Date: 2015-07-22
XI AN JIAOTONG UNIV
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Problems solved by technology

However, the size of semiconductor devices is getting smaller and the operating voltage is getting lower and lower, which means that single event effects are more likely to occur, and the system on chip integrates multiple functional m

Method used

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  • Method for testing single event effect of on-chip system
  • Method for testing single event effect of on-chip system
  • Method for testing single event effect of on-chip system

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[0054] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0055] like figure 1 As shown, several components of the test method of the present invention are illustrated, including the upper computer control unit, the current test module and the lower computer SoC test board. The computer in the main control room in the figure runs the upper computer control software. The current detection unit mainly amplifies the voltage on the sampling resistor R through the amplification circuit, and then converts the voltage through the MSP430 single-chip microcomputer to obtain the working current value after conversion. The test board is located in the irradiation room, and the irradiation source is perpendicular to the SoC chip during the test.

[0056] like figure 2 Shown are several main functions of the host computer management software. Including serial port configuration, test mode configuration...

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Abstract

The invention discloses a method for testing single event effect of an on-chip system. The method includes: dynamically testing single event effect of a register, a high-speed data cache D-cache, an integer operation unit ALU, a floating-point operation unit FPU, direct memory access DMA, an off-chip memory, an on-chip memory and a peripheral unit in a microprocessor of the on-chip system; mainly testing the above function modules dynamically, namely testing occurrence number of single event effect, error data and working current changing condition of the function modules in irradiation environment. By the method, single event effect of different function modules inside the on-chip system can be tested online accurately.

Description

technical field [0001] The invention belongs to the field of single event effect testing, in particular to a system-on-chip single event effect testing method. Background technique [0002] In the space radiation environment of the digital circuit system, due to the radiation effect of cosmic rays and high-energy particles, the semiconductor device of the system may have a single event effect, which seriously affects the reliability, effectiveness and service life of the digital circuit system. The system on chip (SoC) includes different digital circuits, analog circuits, peripheral interfaces and complex bus systems according to its different functional requirements, and it is small in size, light in weight, high in frequency and good in performance, so it is widely used in the aerospace field. certain application value. However, the size of semiconductor devices is getting smaller and the operating voltage is getting lower and lower, which means that single event effects ...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/3167
Inventor 杜雪成刘书焕贺朝会张瑶杜欣
Owner XI AN JIAOTONG UNIV
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