Method for testing single event effect of on-chip system
A single-event effect, system-on-chip technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of complex measurement methods, no unified test method for single-event effect testing, and complex error types, and achieve data processing. The effect of convenient, convenient and quick detection and high degree of automation
Inactive Publication Date: 2015-07-22
XI AN JIAOTONG UNIV
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The invention discloses a method for testing single event effect of an on-chip system. The method includes: dynamically testing single event effect of a register, a high-speed data cache D-cache, an integer operation unit ALU, a floating-point operation unit FPU, direct memory access DMA, an off-chip memory, an on-chip memory and a peripheral unit in a microprocessor of the on-chip system; mainly testing the above function modules dynamically, namely testing occurrence number of single event effect, error data and working current changing condition of the function modules in irradiation environment. By the method, single event effect of different function modules inside the on-chip system can be tested online accurately.
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Technology Topic
Single effectDirect memory access +10
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