Method for rapid detection of SiO2 film thickness and film compact
A compactness and testing method technology, which is applied in the field of rapid detection of SiO2 film thickness and film compactness, can solve the problems of inability to test film thickness and inability to evaluate film compactness, so as to improve test efficiency, increase production capacity, reduce pollution effect
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[0021] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further elaborated below in conjunction with specific embodiments and accompanying drawings, but the following embodiments are only preferred embodiments of the present invention, not all . Based on the examples in the implementation manners, other examples obtained by those skilled in the art without making creative efforts all belong to the protection scope of the present invention.
[0022] A rapid detection of SiO 2 The method of film thickness and film compactness, the test method steps are as follows:
[0023] 1) Acid solution preparation
[0024] Select analytically pure, the preparation ratio is HF:HNO 3 : DI water=2.4%: 1.6%: 96%, store the configured acid solution in a plastic cup;
[0025] 2) Step production (such as figure 1 shown)
[0026] Cut the sample to be tested into small pieces, and paste...
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