Method for improving low mass cutoff value of ion trap mass spectrometer

A technology of ion trap mass spectrometer and cut-off value, which is applied in mass spectrometer, ion source/gun, dynamic spectrometer, etc., can solve problems such as lack, and achieve the effect of simple method and improved performance

Active Publication Date: 2015-09-16
常州磐诺仪器有限公司
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Problems solved by technology

[0025] In Chinese patent 201210468599.2 "A method for tandem mass spectrometry in an ion trap", it is disclosed that the energy of the isolated parent ion is excited by a digital square wave voltage, and then collides with the neutral molecule in the ion trap to dissociate, giving a more Rich ion fragment information; in Chinese patent 201310303472.X "A method for tandem mass spectrometry in an ion trap mass analyzer", it is disclosed that by changing the period size of the radio frequency signal, collision-induced dissociation can be achieved to generate product ions; In Chinese patent 200710045190.9 "A measurement and control method for digital ion trap", the use of high-voltage rectangular driving voltage to improve resolution is disclosed; in Chinese patent 201010622405.0 "A method for improving the performance of ion trap collision-induced dissociation" discloses the passing frequency Modulation eliminates quality discrimination to improve the efficiency of CID; however, there is a lack of research on the limitation of one-third of the low quality cutoff

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  • Method for improving low mass cutoff value of ion trap mass spectrometer
  • Method for improving low mass cutoff value of ion trap mass spectrometer
  • Method for improving low mass cutoff value of ion trap mass spectrometer

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Embodiment Construction

[0044] figure 1 Among them, 11, 12, 13, 14 are the electrodes that make up the linear ion trap, 15 is the power source for ion excitation, and 16 is the main power source for the ion trap.

[0045] figure 2 Among them, the digital power signal generated by the square wave signal power supply is divided into two channels, one is called the main working power of the ion trap, which is directly loaded on a pair of electrodes of the ion trap, and the other is coupled to the main working after being properly modulated. After the power is on, load on another pair of electrodes.

[0046] image 3 In the experiment, the ions generated by the ion source are first introduced into the ion trap, then the ions are collided and cooled, and then the parent ion peak is isolated. The isolation method uses the DAWI method. The isolated precursor ion peaks are subjected to collision-induced dissociation by the conventional method of changing the frequency of digital excitation square wave, and then ...

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Abstract

The invention relates to a method for improving a low mass cutoff value of an ion trap mass spectrometer. A driving working power supply of an iron trap is a digital square wave power supply. The method comprises the steps of: (1) fixing voltage and periods T of the digital square wave power supply for carrying out iron storage and mass selection; (2) entering a collision-induced dissociation CID process of ions, and reducing the periods T of the digital square wave power supply gradually in the CID process so that the selected parent ions are excited to a high energy state and can further perform collision-induced dissociation with neutral molecules in the iron trap to produce fragment ions; (3) and then scanning the periods T of the digital square wave power supply from small to large so as to realize mass analysis of the ions. All the processes are controlled by a computer. The method provided by the invention can solve the problem of limitation of 1 / 3 low mass cutoff value in tandem mass spectrum analysis, realizes the analysis of low mass fragment ions, and significantly improves performance of the digital ion trap mass spectrometry.

Description

Technical field [0001] The invention belongs to the field of mass spectrometer and analysis technology, and specifically relates to a method for improving the low mass cut-off value of an ion trap mass spectrometer. Background technique [0002] The mass spectrometer is a scientific instrument that can accurately analyze the chemical and biological components and their content in samples. It is widely used in modern scientific research and application fields, such as life sciences, environmental protection, food safety, aerospace, materials, geology, Medical and health, etc. The ion trap mass spectrometer, which is simple in structure, small in size, and easy to use, is a mass spectrometer that has been widely used in recent years. It has the high sensitivity and high quality resolution common to all types of mass spectrometers. Ion storage and cascade mass spectrometry are one of the main advantages of ion trap mass spectrometry. It allows people to achieve ion storage, mass a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/42H01J49/10
Inventor 胡佩生
Owner 常州磐诺仪器有限公司
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