Copper alloy for electrical and electronic equipment, copper alloy thin sheet for electrical and electronic equipment, and conductive component and terminal for electrical and electronic equipment

A technology for electrical and electronic components, applied in the fields of copper alloys for electrical and electronic equipment, copper alloy sheets for electrical and electronic equipment, conductive components and terminals for electrical and electronic equipment, which can solve the problem of increased weight and the inability to achieve stress relaxation resistance of copper alloys Sufficient and reliable improvement of copper alloys, failure to achieve stress relaxation resistance characteristics of copper alloys, etc.

Inactive Publication Date: 2015-11-18
MITSUBISHI MATERIALS CORP +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0016] However, in Patent Documents 1 and 2, only the individual contents of Ni, Fe, and P are considered, and it is not always possible to reliably and sufficiently improve the stress relaxation resistance of copper alloys only by adjusting these individual contents.
[0017] In addition, although Patent Document 3 discloses adjusting the Ni/Sn ratio, the relationship between the P compound and the stress relaxation resistance is not considered at all, and it is impossible to achieve a sufficient and reliable improvement of the stress relaxation resistance of the copper alloy.
[0018] Furthermore, in Patent Document 4, the stress relaxation resistance of the copper alloy cannot be sufficiently improved only by adjus

Method used

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  • Copper alloy for electrical and electronic equipment, copper alloy thin sheet for electrical and electronic equipment, and conductive component and terminal for electrical and electronic equipment
  • Copper alloy for electrical and electronic equipment, copper alloy thin sheet for electrical and electronic equipment, and conductive component and terminal for electrical and electronic equipment
  • Copper alloy for electrical and electronic equipment, copper alloy thin sheet for electrical and electronic equipment, and conductive component and terminal for electrical and electronic equipment

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Embodiment

[0145] Hereinafter, the results of confirmation experiments conducted to confirm the effects of the present invention are shown together with comparative examples as examples of the present invention. In addition, the following examples are examples for illustrating the effects of the present invention, and the structures, processes, and conditions described in the examples do not limit the technical scope of the present invention.

[0146] First, a raw material composed of a Cu-40% Zn master alloy and oxygen-free copper (ASTMB152C10100) with a purity of 99.99% by mass or higher was prepared, which was placed in a high-purity graphite crucible, and the 2 Melt in an electric furnace under a gas atmosphere. Various additive elements were added to the copper alloy melt, the alloy melt having the composition shown in Tables 1 and 2 was melted, and poured into a mold to produce an ingot. In addition, the size of the ingot was about 25 mm in thickness x about 50 mm in width x about...

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Abstract

Provided is a copper alloy for electrical and electronic equipment, having reliable and sufficiently excellent stress relaxation properties and having excellent strength and bending workability. Also provided are a copper alloy thin sheet for electrical and electronic equipment and a conductive component and a terminal for electrical and electronic equipment. The copper alloy for electrical and electronic equipment comprises 23-36.5 mass% Zn, 0.1-0.9 mass% Sn, at least 0.15 mass% but less than 1.0 mass% Ni, at least 0.001 mass% but less than 0.10 mass% Fe, and 0.005-0.1 mass% P, with the remainder being Cu and unavoidable impurities. Said copper alloy for electrical and electronic equipment fulfils, by atomic rate, 0.002≤Fe/Ni<0.7, 3<(Ni+Fe)/P<15, and 0.3<Sn/(Ni+Fe)<2.9. The special grain boundary length ratio (Lσ/L), being the ratio between the sum (Lσ) of each grain boundary length for Σ3, Σ9, Σ27a, and Σ27b and the length (L) of all crystal grain boundaries is at least 10%.

Description

technical field [0001] The present invention relates to a Cu-Zn-Sn series copper alloy for electrical and electronic equipment used as a connector of a semiconductor device, other terminals, a movable conductive sheet of an electromagnetic relay, or a conductive element for an electrical and electronic equipment such as a lead frame, and its use The copper alloy thin plate for electronic and electrical equipment of the copper alloy for electronic and electrical equipment, a conductive element and a terminal for electronic and electrical equipment. [0002] This application claims priority based on Patent Application No. 2013-055052 for which it applied in Japan on March 18, 2013, and uses the content here. Background technique [0003] Cu—Zn alloys have conventionally been widely used as the above-mentioned conductive elements for electronic and electrical equipment from the viewpoints of strength, workability, cost balance, and the like. [0004] In addition, in the case o...

Claims

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Application Information

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IPC IPC(8): C22C9/04H01B1/02H01B5/02H01L23/48H01L23/50C22F1/00C22F1/08
CPCH01B1/026C22C9/04C22F1/00C22F1/08H01L23/49579H01L2924/0002
Inventor 牧一诚森广行山下大树
Owner MITSUBISHI MATERIALS CORP
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